# US 11,113,364 B2 · Time series data analysis control method and analysis control device

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- Number: US 11,113,364 B2
- Document ID: US11113364B2
- Status: Granted
- Kind: B2
- Application number: 16/610,130
- Filed: 2017-05-08
- Published: 2020-03-19
- Granted: 2021-09-07
- Earliest claimed: 2017-05-08
- Assignees: Hitachi, Ltd.
- Applicants: Hitachi, Ltd.
- Inventors: Hiromitsu Nakagawa; Keiro Muro
- Web page: https://patentgrep.com/patent/US11113364B2

## CPC

- G06F 17/18: for evaluating statistical data {, e.g. average values, frequency distributions, probability functions, regression analysis (forecasting specially adapted for a specific administrative, business or logistic context G06Q10/04)}
- G01D 21/02: Measuring two or more variables by means not covered by a single other subclass
- G05B 23/0224: {Process history based detection method, e.g. whereby history implies the availability of large amounts of data}
- G05B 23/0281: {Quantitative, e.g. mathematical distance; Clustering; Neural networks; Statistical analysis}
- G06Q 10/04: Forecasting or optimisation specially adapted for administrative or management purposes, e.g. linear programming or "cutting stock problem" (market predictions or forecasting for commercial activities G06Q30/0202)
- G06Q 10/0639: Performance analysis of employees; Performance analysis of enterprise or organisation operations
- G06F: ELECTRIC DIGITAL DATA PROCESSING (computer systems based on specific computational models G06N)
- G01D: MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G05B: CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS (systems for controlling or regulating non-electric variables G05D; systems for regulating electric or magnetic variables G05F; control devices or systems insofar as characterised by mechanical features only G05G)
- G06Q: INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR

## Abstract

An analysis control device controls an analysis based on time series data for each of a plurality of sensors corresponding to a plurality of components that constitute a target device. The analysis control device acquires sensor data sets belonging to an analysis target time zone among the time series data of each of the plurality of sensors. Each sensor data set includes measurement values measured by a sensor. The analysis control device calculates an evaluation value according to a simple evaluation by using two or more sensor data sets corresponding to the sensor among the plurality of sensor data sets belonging to the analysis target time zone. The analysis control device sets an execution order of the analysis based on the measurement values of the sensor within a restricted time corresponding to the analysis target time zone in a descending order of the calculated evaluation value.

## Claims

### Claim 1

An analysis control device that controls an analysis based on time series data of each of a plurality of sensors corresponding to a plurality of components that constitute a target device, the analysis control device comprising:
a storage unit including one or more memories; and
a processor unit including one or more processors connected to the storage unit, wherein
the processor unit is configured to:
(A) acquire a sensor data set belonging to an analysis target time zone among the time series data of each of the plurality of sensors,
each sensor data set including a measurement value that is a value measured by a sensor corresponding to the sensor data set,
(B) calculate, for each of the plurality of sensors, an evaluation value according to a simple evaluation by using two or more sensor data sets corresponding to the sensor among the plurality of sensor data sets belonging to the analysis target time zone, and
(C) set an execution order of the analysis based on the measurement value of the sensor within a restricted time corresponding to the analysis target time zone in a descending order of the evaluation value calculated in (B).

### Claim 2 (depends on 1)

The analysis control device according to claim 1, wherein
in (B), for each of the plurality of sensors, the simple evaluation is to perform at least one of the following (b1) and (b2),
(b1) calculating a detection probability, which is a value meaning possibility of occurrence of an abnormality in a component corresponding to the sensor based on two or more measurement values of two or more sensor data sets corresponding to the sensor among the plurality of sensor data sets belonging to the analysis target time zone,
(b2) calculating a phenomenon deviation degree which is a value based on a relative relationship between a plurality of measurement values of the plurality of sensor data sets belonging to the analysis target time zone and two or more measurement values of two or more sensor data sets corresponding to the sensor, and
in (B), the processor unit is configured to calculate, for each of the plurality of sensors, the evaluation value according to a predetermined evaluation policy by using at least one of the detection probability calculated in (b1) and the phenomenon deviation degree calculated in (b2).

### Claim 3 (depends on 2)

The analysis control device according to claim 2, wherein
in (B), for each of the plurality of sensors, the simple evaluation includes both (b1) and (b2), and
in (B), the processor unit is configured to calculate, for each of the plurality of sensors, the evaluation value by using both the detection probability calculated in (b1) and the phenomenon deviation degree calculated in (b2).

### Claim 4 (depends on 2)

The analysis control device according to claim 2, wherein
in (B), for each of the plurality of sensors, the simple evaluation is to further perform the following (b3),
(b3) calculating an operation influence degree, which is a value based on a cost related to maintenance of the component corresponding to the sensor, and
in (B), the processor unit is configured to calculates, for each of the plurality of sensors, the evaluation value by using the business influence degree calculated in (b3) and at least one of the detection probability calculated in (b1) and the phenomenon deviation degree calculated in (b2).

### Claim 5 (depends on 1)

The analysis control device according to claim 1, wherein
in (B), for each of the plurality of sensors, the evaluation value is a value calculated according to a predetermined evaluation policy in addition to the simple evaluation.

### Claim 6 (depends on 5)

The analysis control device according to claim 5, wherein
the predetermined evaluation policy is an evaluation policy having a highest evaluation accuracy among a plurality of evaluation policies, and
the processor unit is configured to:
(D) update the evaluation accuracy of the predetermined evaluation policy based on a matching degree between a sensor arrangement in a descending order of an abnormality degree and a sensor arrangement in a descending order of the evaluation value calculated in (B),
one or more abnormality degrees respectively corresponding to one or more sensors being one or more values calculated respectively for the one or more sensors based on the two or more measurement values corresponding to the one or more sensors by the analysis within the restricted time corresponding to the analysis target time zone.

### Claim 7 (depends on 6)

The analysis control device according to claim 6, wherein
the processor unit is configured to display the plurality of evaluation policies and a plurality of evaluation accuracies respectively corresponding to the plurality of evaluation policies, and
the processor unit is configured to receive selection of the plurality of evaluation policies.

### Claim 8 (depends on 1)

The analysis control device according to claim 1, wherein
the processor unit is configured to calculate, for each of two or more sensors, a time estimation required for analysis based on two or more sensor data sets belonging to the analysis target time zone, and
the processor unit is configured to display the evaluation value and the time estimation for each of the two or more sensors, and an analysis progress.

### Claim 9

An analysis control method that controls an analysis based on time series data of each of a plurality of sensors corresponding to a plurality of components that constitute a target device, the analysis control method comprising:
(A) acquiring a sensor data set belonging to an analysis target time zone among the time series data of each of the plurality of sensors;
each sensor data set including a measurement value that is a value measured by a sensor corresponding to the sensor data set,
(B) calculating, for each of the plurality of sensors, an evaluation value according to a simple evaluation by using two or more sensor data sets corresponding to the sensor among the plurality of sensor data sets belonging to the analysis target time zone; and
(C) setting an execution order of the analysis based on the measurement value of the sensor within a restricted time corresponding to the analysis target time zone in a descending order of the evaluation value calculated in (B).