# US 11,112,528 B2 · Multi-energy-spectrum X-ray imaging system and method of substance identification of item to be inspected by using the same > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 11,112,528 B2 - Document ID: US11112528B2 - Status: Granted - Kind: B2 - Application number: 16/314,093 - Filed: 2017-09-12 - Published: 2020-10-01 - Granted: 2021-09-07 - Earliest claimed: 2016-12-07 - Assignees: Nuctech Company Limited - Applicants: Nuctech Company Limited - Inventors: Guangming Xu; Bicheng Liu; Ziran Zhao; Jianping Gu; Qiang Li; Lan Zhang - Web page: https://patentgrep.com/patent/US11112528B2 ## CPC - G01V 5/224: {Multiple energy techniques using one type of radiation, e.g. X-rays of different energies} - G01N 23/087: using polyenergetic X-rays - G01N 23/10: the material being confined in a container, e.g. in a luggage X-ray scanners - G01R 23/18: with provision for recording frequency spectrum - G01N 2223/405: mapping of a material property - G01N 2223/423: multispectral imaging-multiple energy imaging - G01V: GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS (means for indicating the location of accidentally buried, e.g. snow-buried, persons A63B29/02) - G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q) - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) ## Abstract The present disclosure discloses a method of substance identification of an item to be inspected using a multi-energy-spectrum X-ray imaging system, the method comprising: acquiring a transparency related vector consisting of transparency values of the item to be inspected in N energy regions, wherein N is greater than 2; calculating distances between the transparency related vector and transparency related vectors stored in the system consisting of N transparency mean values of multiple kinds of items with multiple thicknesses in the N energy regions; and identifying the item to be inspected as the item corresponding to the minimum distance. The present disclosure is based on a multi-energy-spectrum X-ray imaging system, and proposes a method of substance identification by analyzing the multi-energy-spectrum substance identification issue. Compared with the conventional dual-energy X-ray system, the multi-spectrum imaging can significantly improve the system's ability to identify substances in theory, especially in the field of security applications. The improvement of substance identification is important for contraband inspection, such as, drugs, explosives. ## Claims ### Claim 1 A method of substance identification of an item to be inspected using a multi-energy-spectrum X-ray imaging system, the method comprising: acquiring a transparency related vector consisting of transparency values of the item to be inspected in N energy regions, wherein N is greater than 2; and determining the item to be inspected based on the transparency related vector; wherein the determining the item to be inspected based on the transparency related vector comprises: calculating distances between the transparency related vector and transparency related vectors stored in the system consisting of N transparency mean values of multiple kinds of items with multiple thicknesses in the N energy regions; and determining a first atomic number and a first thickness of the item corresponding to the minimum distance and a second atomic number and a second thickness of an item corresponding to the next minimum distance; determining an atomic number and a thickness of the item to be inspected by using a linear interpolation algorithm based on the first and second atomic numbers and the first and second thicknesses; and determining a kind of the item to be inspected based on the atomic number and the thickness of the item to be inspected. ### Claim 2 (depends on 1) The method of claim 1, wherein the determining one of the set of mapping points which is closest to the mapping point comprises: determining a point which is closest to the mapping point by using the Mahalanobis distance algorithm, the Euclidean distance algorithm, or the Cosine distance algorithm. ### Claim 3 A method of substance identification of an item to be inspected using a multi-energy-spectrum X-ray imaging system, the method comprising: acquiring a transparency related vector consisting of transparency values of the item to be inspected in N energy regions, wherein N is greater than 2; and determining the item to be inspected based on the transparency related vector, wherein the determining the item to be inspected based on the transparency related vector comprises: mapping the transparency related vector and transparency related vectors stored in the system consisting of N transparency mean values of multiple kinds of items with multiple thicknesses in the N energy regions into a two-dimensional plane by using a non-linear dimension reduction algorithm, so as to acquire a mapping point of the transparency related vector of the item to be inspected in the two-dimensional plane and a set of mapping points of the transparency related vectors of the multiple kinds of items in the two-dimensional plane, respectively; determining one of the set of mapping points which is closest to the mapping point; and identifying the item to be inspected as the one of the multiple kinds of items corresponding to the closest point. ### Claim 4 (depends on 3) The method of claim 3, wherein the determining one of the set of mapping points which is closest to the mapping point comprises determining a point which is closest to the mapping point by using the Mahalanobis distance algorithm, the Euclidean distance algorithm, or the Cosine distance algorithm. ### Claim 5 A method of substance identification of an item to be inspected using a multi-energy-spectrum X-ray imaging system, the method comprising: acquiring a transparency related vector consisting of transparency values of the item to be inspected in N energy regions, wherein N is greater than 2; and determining the item to be inspected based on the transparency related vector; wherein the determining the item to be inspected based on the transparency related vector comprises: selecting one or more of the N energy regions as reference energy regions; acquiring respective N transparency values of the item to be inspected in the N energy regions based on the transparency related vector; calculating a reference transparency value based on the transparency values of the item to be inspected in the one or more energy regions which are selected as the reference regions; calculating a relative mass attenuation coefficient value of the item to be inspected in the N energy regions based on the reference transparency value and the N transparency values; determining one of the multiple kinds of items having a relative mass attenuation coefficient value closest to the relative mass attenuation coefficient value, and identifying the item to be inspected as the determined item. ### Claim 6 (depends on 5) The method of claim 5, wherein the determining one of the multiple kinds of items having a relative mass attenuation coefficient value closest to the relative mass attenuation coefficient value and the identifying the item to be inspected as the determined item comprises: determining one of the multiple kinds of items having a relative mass attenuation coefficient value closest to the relative mass attenuation coefficient value by using the minimum mean square error method. ### Claim 7 (depends on 5) The method of claim 5, wherein the determining one of the set of mapping points which is closest to the mapping point comprises determining a point which is closest to the mapping point by using the Mahalanobis distance algorithm, the Euclidean distance algorithm, or the Cosine distance algorithm. ### Claim 8 A multi-energy-spectrum X-ray imaging system, comprising: an X-ray source configured to generate an X-ray; a detector configured to receive the X-ray which is emitted from the X-ray source and is transmitted through or scattered by an item to be inspected and convert the received X-ray into an output signal; a processor configured to execute program instructions to be operable to acquire, based on the output signal, a transparency related vector consisting of transparency values of the item to be inspected in N energy regions, wherein N is greater than 2; and determine the item to be inspected based on the transparency related vector; and a memory configured to store the program instructions; wherein the processor is further configured to determine the item to be inspected based on the transparency related vector by: calculating distances between the transparency related vector and transparency related vectors stored in the system consisting of N transparency mean values of multiple kinds of items with multiple thicknesses in the N energy regions; and determining a first atomic number and a first thickness of the item corresponding to the minimum distance and a second atomic number and a second thickness of an item corresponding to the next minimum distance; determining an atomic number and a thickness of the item to be inspected by using a linear interpolation algorithm based on the first and second atomic numbers and the first and second thicknesses; and determining a kind of the item to be inspected based on the atomic number and the thickness of the item to be inspected. ### Claim 9 A multi-energy-spectrum X-ray imaging system, comprising: an X-ray source configured to generate an X-ray; a detector configured to receive the X-ray which is emitted from the X-ray source and is transmitted through or scattered by an item to be inspected and convert the received X-ray into an output signal; a processor configured to execute program instructions to be operable to acquire, based on the output signal, a transparency related vector consisting of transparency values of the item to be inspected in N energy regions, wherein N is greater than 2; and determine the item to be inspected based on the transparency related vector; and a memory configured to store the program instructions, wherein the processor is further configured to determine the item to be inspected based on the transparency related vector by: mapping the transparency related vector and transparency related vectors stored in the system consisting of N transparency mean values of multiple kinds of items with multiple thicknesses in the N energy regions into a two-dimensional plane by using a non-linear dimension reduction algorithm, so as to acquire a mapping point of the transparency related vector of the item to be inspected in the two-dimensional plane and a set of mapping points of the transparency related vectors of the multiple kinds of items in the two-dimensional plane, respectively; determining one of the set of mapping points which is closest to the mapping point; and identifying the item to be inspected as the one of the multiple kinds of items corresponding to the closest point. ### Claim 10 (depends on 9) The system of claim 9, wherein the processor is further configured to: determine a point of the set of mapping points which is closest to the mapping point by using the Mahalanobis distance algorithm, the Euclidean distance algorithm, or the Cosine distance algorithm. ### Claim 11 A multi-energy-spectrum X-ray imaging system, comprising: an X-ray source configured to generate an X-ray; a detector configured to receive the X-ray which is emitted from the X-ray source and is transmitted through or scattered by an item to be inspected and convert the received X-ray into an output signal; a processor configured to execute program instructions to be operable to acquire, based on the output signal, a transparency related vector consisting of transparency values of the item to be inspected in N energy regions, wherein N is greater than 2; and determine the item to be inspected based on the transparency related vector; and a memory configured to store the program instructions, wherein the processor is further configured to determine the item to be inspected based on the transparency related vector by: selecting one or more of the N energy regions as reference energy regions; acquiring respective N transparency values of the item to be inspected in the N energy regions based on the transparency related vector; calculating a reference transparency value based on the transparency values of the item to be inspected in the one or more energy regions which are selected as the reference regions; calculating a relative mass attenuation coefficient value of the item to be inspected in the N energy regions based on the reference transparency value and the N transparency values; and determining one of the multiple kinds of items having a relative mass attenuation coefficient value closest to the relative mass attenuation coefficient value, and identifying the item to be inspected as the determined item. ### Claim 12 (depends on 11) The system of claim 11, wherein the processor is further configured to: determining one of the multiple kinds of items having a relative mass attenuation coefficient value closest to the relative mass attenuation coefficient value by using the minimum mean square error method.