Scan based test design in serdes applications
AssigneeCredo Technology Group Limited
InventorsHaoli Qian, Yifei Dai, Ruiqing Sun
Life of this patent
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Abstract
A method for testing operation of a device under test (DUT) includes receiving an input bit stream at an input pin, the input bit stream including multiplexed test patterns for a plurality of scan chains of the DUT. The method further includes demultiplexing the multiplexed test patterns, and providing a corresponding test pattern data to each of the plurality of scan chains. The method further includes, at each of the plurality of scan chains, scanning test results from the scan chain, to produce multiplex output test data into an output bit stream.
Claims14
A testing method that comprises:
- receiving an input bit stream via an input pin of a serializer/deserializer (SerDes) port of a device under test (DUT), the input bit stream including interleaved test patterns;
- demultiplexing the input bit stream to concurrently provide a de-interleaved test pattern to each of multiple scan chains in the DUT;
- processing the de-interleaved test patterns from the multiple scan chains to obtain test results that are stored by the multiple scan chains;
- multiplexing the test results from each of the multiple scan chains to provide an output bit stream having interleaved test results, the multiplexing including:
- prepending pre-frame bits to the test results from each scan chain;
- interleaving the pre-frame bits to form a start frame delimiter that indicates a beginning of a test result frame;
- and
- interleaving the test results in a bitwise fashion to form a payload for the test result frame;
- and
- transmitting the output bit stream via an output pin of the SerDes port.
An integrated circuit device that comprises:
- an input pin and an output pin of a serializer/deserializer (SerDes) port;
- a test receiver that receives an input bit stream via the input pin, the input bit stream including interleaved test patterns, the test receiver including a demultiplexer that converts the interleaved test patterns into parallel, de-interleaved test patterns;
- multiple scan chains that each store a corresponding one of the de-interleaved test patterns;
- one or more components that operate on the stored test patterns to produce vectors of test results stored by the multiple scan chains;
- and
- a test transmitter that transmits an output bit stream via the output pin, the test transmitter including a multiplexer that interleaves parallel test result vectors with prepended pre-frame bits into a test result frame having a start frame delimiter and a payload of interleaved test results for the output bit stream.
Dependencies are inferred from the claim text.