Signal skew measurement method, apparatus, medium, and electronic device

A signal skew measurement apparatus, applicable to an integrated circuit (IC), the apparatus comprising:

• an under-sampling module, configured to acquire a first signal and a second signal output by the IC, and respectively perform under-sampling on the first signal and the second signal to obtain a first sampled signal and a second sampled signal;
• a digital conversion module, configured to respectively perform digital conversion on the first sampled signal and the second sampled signal based on a preset threshold voltage to obtain a first digital signal and a second digital signal;
• a convolution module, configured to respectively perform convolution on the first digital signal and the second digital signal using a preset pulse signal to obtain a first comparison signal and a second comparison signal;
• and
• a skew measurement module, configured to calculate a skew between the first comparison signal and the second comparison signal to obtain a reference skew, calculate a product of the reference skew and an effective sampling period, and assign the product to the skew between the first signal and the second signal.