Method and apparatus for controlling tester, medium and electronic device
AssigneeChangxin Memory Technologies, Inc.
InventorYubin Lu
Life of this patent
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Abstract
A method and apparatus for controlling a tester, related medium and electronic device are provided. The apparatus includes a vibration data collector attached on a side wall of the tester to collect vibration data from the tester during operation thereof. The method includes: receiving the vibration data collected by the vibration data collector; comparing the vibration data with a predetermined threshold to generate a comparison result; and controlling an operating state of the tester based on the comparison result. This method may timely identify any instability of the tester and prompt for repair if necessary. It substantially reduces the time and material costs associated with a test, and thus reduces the non-chip-attributable defect rate.
Claims20
A tester control apparatus for controlling an Integrated Circuit (IC) tester, the tester control apparatus connected to a vibration data collector and the IC tester, the vibration data collector coupled to a side wall of the IC tester for collecting vibration data from the IC tester during operation of the IC tester, wherein the tester control apparatus comprises:
- a reception module configured to receive, from the vibration data collector, the vibration data;
- a comparison module configured to compare the vibration data with a predetermined threshold to generate a comparison result;
- and
- a control module configured to control, based on the comparison result, an operating state of the IC tester.
An Integrated Circuit (IC) tester, comprising:
- a vibration data collector attached on a side wall of the IC tester for collecting vibration data from the IC tester during operation of the IC tester;
- and
- a tester controller, coupled to the vibration data collector for acquiring the vibration data collected from the IC tester during the operation of the IC tester.
A method for controlling an Integrated Circuit (IC) tester, comprising:
- receiving, from a vibration data collector, vibration data, the vibration data collector coupled on a side wall of the IC tester for collecting vibration data from the IC tester during operation of the IC tester;
- comparing the vibration data with a predetermined threshold to generate a comparison result;
- and
- controlling, based on the comparison result, an operating state of the IC tester.
Dependencies are inferred from the claim text.