Method for differential/common-mode noise figure measurements
AssigneeAnritsu Corporation
InventorJon S Martens
Life of this patent
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Abstract
A system for measuring noise characteristics of a device under test (DUT) includes one or more computers and memory, a first receiver connected to a first port of the DUT, a second receiver connected to a second port of the DUT, the second receiver being synchronized with the first receiver and a non-transitory computer readable storage medium having instructions thereon that when read and executed by the one or more computers causes the system to transmit signals to the DUT, receive signals from the DUT, and characterize noise associated with the DUT within the received signals.
Claims20
A system for measuring noise characteristics of a device under test (DUT), the system comprising:
- a first preamplifier and a second preamplifier;
- a first receiver connected by the first preamplifier to a first port of the DUT;
- a second receiver connected by the second preamplifier to a second port of the DUT;
- a clock, wherein the first receiver and the second receiver are both synchronized with said clock, whereby, the second receiver is synchronized with the first receiver;
- and
- wherein the system is configured to sample signals received from the first port of the DUT and the second port of the DUT while maintaining phase information in said signal samples;
- and
- wherein the system is configured to characterize noise associated with the DUT from said sampled signals.
A system for measuring noise characteristics of a differential amplifier (DA), the system comprising:
- a clock;
- a first preamplifier and a second preamplifier;
- a first receiver synchronized with said clock and connected by the first preamplifier to a first port of the DA;
- a second receiver synchronized with said clock and connected by the second preamplifier to a second port of the DA;
- wherein the system is configured to sample signals received from the first port of the DA and the second port of the DA while maintaining phase information in said signal samples;
- and
- wherein the system is configured to characterize noise associated with the DA from said sampled signals.
A method for measuring noise characteristics of a device under test (DUT), the method comprising:
- providing a vector network analyzer (VNA) comprising a first receiver, a second receiver, a first preamplifier, a second preamplifier and a clock;
- synchronizing the first preamplifier and the second preamplifier with the clock whereby the second preamplifier is synchronized with the first preamplifier;
- connecting the first receiver to a first port of the DUT through the first preamplifier;
- connecting the second receiver connected to a second port of the DUT though the second preamplifier;
- sampling signals received from the first port of the DUT using the first receiver to create first signal samples;
- sampling signals received from the second port of the DUT using the second receiver to create second signal samples;
- maintaining phase information in said first signal samples and second signal samples;
- and
- characterizing noise associated with the DUT from said first signal samples and second signal samples.
Dependencies are inferred from the claim text.