Measurement apparatus
AssigneeToshiba Memory Corporation
InventorKen Hoshino
Life of this patent
Estimating the term…
Abstract
According to one embodiment, a measurement apparatus includes a magnetic field generation section that applies a predetermined magnetic field to a device under test. A current source supplies a current of a rectangular wave to the device under test in a direction of crossing the magnetic field. A voltage measurement section measures a voltage difference generated in the device under test. A restoration section demodulates the voltage difference using a demodulated signal having the same frequency as a frequency of the rectangular wave and synchronized with the rectangular wave, removes harmonic components from the demodulated voltage difference, and restores an electromotive voltage generated in the device under test. A computing section measures the device under test using low frequency components of the electromotive voltage.
Claims14
A measurement apparatus comprising:
- a magnetic field generator that applies a predetermined magnetic field to a device under test;
- a current source that supplies a current with a rectangular wave to the device under test in a direction crossing the magnetic field;
- a voltage detector that measures a voltage difference generated in the device under test;
- and
- one or more processors configured to:
- demodulate the voltage difference using a demodulated signal having a substantially similar frequency to a frequency of the rectangular wave and synchronized with the rectangular wave;
- remove harmonic components from the demodulated voltage difference to restore an electromotive voltage generated in the device under test;
- and
- measure the device under test based on the restored electromotive voltage.
A method, comprising:
- applying a predetermined magnetic field to a device under test;
- supplying a current with a rectangular wave to the device under test in a direction crossing the magnetic field;
- measuring a voltage difference generated in the device under test;
- demodulating the voltage difference using a demodulated signal having a substantially similar frequency to a frequency of the rectangular wave and synchronized with the rectangular wave;
- removing harmonic components from the demodulated voltage difference to restore an electromotive voltage generated in the device under test;
- and
- measuring the device under test based on the restored electromotive voltage.
A system comprising:
- one or more hardware processors configured by machine-readable instructions to:
- measure a voltage difference generated in a device under test, wherein the device under test is applied with a predetermined magnetic field and a current with a rectangular wave in a direction crossing the magnetic field;
- demodulate the voltage difference using a demodulated signal having a substantially similar frequency to a frequency of the rectangular wave and synchronized with the rectangular wave;
- remove harmonic components from the demodulated voltage difference to restore an electromotive voltage generated in the device under test;
- and
- measure the device under test based on the restored electromotive voltage.
Dependencies are inferred from the claim text.