Apparatus and method for measuring particulate matter
AssigneeSamsung Electronics Co., Ltd.
InventorsWoo Chang Lee, Yun S Park, Ho Jun Chang, Sung Hyun Nam
Life of this patent
Estimating the term…
Abstract
Provided is an apparatus for measuring particulate matter including an image obtaining device configured to charge particulate matter particles included in air that is introduced to the image obtaining device, and to obtain an image of the charged particulate matter particles based on lens-free imaging, a spectrum obtaining device configured to obtain a Raman spectrum of the charged particulate matter particles, and a processor configured to determine a size of the particulate matter particles and a concentration of the particulate matter particles based on the obtained image, and to determine components of the particulate matter particles based on the obtained Raman spectrum.
Claims20
An apparatus for measuring particulate matter, the apparatus comprising:
- an image obtaining device configured to charge particulate matter particles included in air that is introduced to the image obtaining device, and to obtain an image of the charged particulate matter particles based on lens-free imaging;
- a spectrum obtaining device configured to obtain a Raman spectrum of the charged particulate matter particles;
- and
- a processor configured to determine a size of the particulate matter particles and a concentration of the particulate matter particles based on the obtained image, and to determine components of the particulate matter particles based on the obtained Raman spectrum.
A method of measuring particulate matter, the method comprising:
- charging particulate matter particles included in air;
- obtaining an image of the charged particulate matter particles based on lens-free imaging;
- obtaining a Raman spectrum of the charged particulate matter particles;
- determining a size of the particulate matter particles and a concentration of the particulate matter particles based on the obtained image;
- and
- determining components of the particulate matter particles based on the obtained Raman spectrum.
An apparatus for measuring particulate matter, the apparatus comprising:
- an image obtaining device configured to charge particulate matter particles included in air that is introduced to the image obtaining device, and to obtain an image of the charged particulate matter particles based on lens-free imaging;
- a waveguide into which the charged particulate matter particles are introduced;
- a spectrum obtaining device configured to obtain a Raman spectrum of the charged particulate matter particles by receiving the Raman scattered light of the charged particulate matter particles introduced into the waveguide;
- and
- a processor configured to determine a size of the particulate matter particles and a concentration of the particulate matter particles based on the obtained image, and to determine components of the particulate matter particles based on the obtained Raman spectrum.
Dependencies are inferred from the claim text.