# US 11,112,345 B2 · Microparticle measurement device and cleaning method for microparticle measurement device

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- Number: US 11,112,345 B2
- Document ID: US11112345B2
- Status: Granted
- Kind: B2
- Application number: 16/305,885
- Filed: 2017-03-07
- Published: 2020-10-08
- Granted: 2021-09-07
- Earliest claimed: 2016-06-10
- Assignees: Sony Corporation
- Applicants: Sony Corporation
- Inventors: Yoshitsugu Sakai; Masaaki Abe; Koichi Tsukihara; Shoji Akiyama; Shinichi Hasegawa
- Web page: https://patentgrep.com/patent/US11112345B2

## CPC

- G01N 15/1434: Optical arrangements
- G01N 15/1459: {the analysis being performed on a sample stream}
- G01N 15/14: Optical investigation techniques, e.g. flow cytometry
- G01N 21/53: within a flowing fluid, e.g. smoke
- G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q)

## Abstract

Provided is a microparticle measurement device including a light emission unit that emits light to a microparticle to be analyzed and a light detection unit that detects light generated from the microparticle at a predetermined detection position. The microparticle measurement device further includes an analysis unit that is connected to the light detection unit and analyzes a detection value of the light detected by the light detection unit. The light detection unit is movable from the detection position.

## Claims

### Claim 1

A microparticle measurement device, comprising:
a light emission unit configured to emit first light to a microparticle;
a light detection unit configured to detect, at a specific detection position, second light generated from the microparticle;
an analysis unit connected to the light detection unit, wherein
the analysis unit is configured to analyze a detection value of the second light detected by the light detection unit, and
the light detection unit is movable from the specific detection position; and
a rotational shaft portion connected to the light detection unit, wherein
the rotational shaft portion is configured to define a specific rotational axis, and
the light detection unit is rotatable around the specific rotational axis with respect to the specific detection position, wherein the light detection unit is movable from the specific detection position to clean the microparticle measurement device.

### Claim 2 (depends on 1)

The microparticle measurement device according to claim 1, wherein the light detection unit is a forward scattered light detection unit.

### Claim 3 (depends on 1)

The microparticle measurement device according to claim 1, wherein
the specific detection position faces the light emission unit interposing the microparticle, and
the specific detection position is a preset position such that the second light generated from the microparticle is detectable.

### Claim 4 (depends on 1)

The microparticle measurement device according to claim 1, wherein
the light detection unit is movable upward with respect to the specific detection position, and
the upward movement of the light detection unit is concurrent with the rotation of the light detection unit around the specific rotational axis.

### Claim 5 (depends on 1)

The microparticle measurement device according to claim 1, wherein the light detection unit is movable in at least one of a horizontal direction or a vertical direction with respect to the specific detection position.

### Claim 6 (depends on 1)

The microparticle measurement device according to claim 1, further comprising a housing that houses the light emission unit and the analysis unit,
wherein the light detection unit is completely separable from the housing.

### Claim 7 (depends on 1)

The microparticle measurement device according to claim 1, wherein the analysis unit is electrically connected to the light detection unit.

### Claim 8 (depends on 1)

The microparticle measurement device according to claim 1, wherein the light detection unit includes a light receiving element configured to receive the second light generated from the microparticle.

### Claim 9 (depends on 8)

The microparticle measurement device according to claim 8, wherein
the light detection unit further includes a light shielding portion between the light emission unit and the light receiving element, and
the light shielding portion is configured to shield a part of the second light generated from the microparticle.

### Claim 10 (depends on 1)

The microparticle measurement device according to claim 1, further comprising:
a housing that houses the light emission unit and the analysis unit; and
a cover detachable from the housing,
wherein the light detection unit is coverable by the cover.

### Claim 11

A cleaning method for a microparticle measurement device, comprising:
moving a light detection unit from a specific detection position in the microparticle measurement device; and
cleaning the microparticle measurement device based on the movement of the light detection unit,
wherein the microparticle measurement device includes:
a light emission unit configured to emit first light to a microparticle;
the light detection unit configured to detect, at the specific detection position, second light generated from the microparticle;
an analysis unit connected to the light detection unit,
wherein the analysis unit is configured to analyze a detection value of the second light detected by the light detection unit; and
a rotational shaft portion connected to the light detection unit, wherein
the rotational shaft portion is configured to define a specific rotational axis, and
the light detection unit is rotatable around the specific rotational axis with respect to the specific detection position.