Calibration target shift compensation
AssigneeHewlett-Packard Development Company, L.P.
InventorHsue-Yang Liu
Life of this patent
Estimating the term…
Abstract
According to examples, an apparatus may include a processor and a memory on which is stored machine readable instructions that are to cause the processor to determine a size of a chip gap between a first sensor chip and a second sensor chip, access a model that estimates an amount of positional shift of a target centroid, and apply the determined chip gap size and the accessed model on an image captured using the first sensor chip and the second sensor chip to compensate for an estimated positional shift in a centroid of a calibration target in the captured image by causing a location of the calibration target centroid in the captured image to more accurately correspond to an actual location of the calibration target centroid on an object from which the captured image was captured.
Claims15
An apparatus comprising:
- a processor;
- and
- a memory on which is stored machine readable instructions that are to cause the processor to:
- determine a size of a chip gap between a first sensor chip and a second sensor chip;
- access a model that estimates an amount of positional shift of a target centroid;
- and
- apply the determined chip gap size and the accessed model on an image captured using the first sensor chip and the second sensor chip to compensate for an estimated positional shift in a centroid of a calibration target in the captured image by causing a location of the calibration target centroid in the captured image to more accurately correspond to an actual location of the calibration target centroid on an object from which the captured image was captured.
A method comprising:
- accessing, by a processor, a model that estimates a positional shift of a target centroid in an image due to an impact of a chip gap between sensor chips that were used to capture the image;
- accessing, by the processor, an image of a pattern of calibration targets captured with the sensor chips, the accessed image being impacted by the chip gap between the sensor chips;
- measuring, by the processor, a size of the chip gap from the accessed image of the pattern of calibration targets;
- and
- applying, by the processor, the accessed model and the measured chip gap size on the accessed image to compensate for an estimated positional shift caused by the chip gap in a centroid of the calibration target in the pattern of calibration targets to cause a location of the calibration target centroid in the accessed image to more accurately correspond to an actual location of the calibration target centroid on an object from which the accessed image of the pattern of calibration targets was captured.
A non-transitory computer readable medium on which is stored machine readable instructions that when executed by a processor cause the processor to:
- access a model that estimates an amount of positional shift of an element centroid in a captured image caused by a chip gap between a first sensor chip and a second sensor chip in a scan bar used to capture the image;
- access an image including a calibration element captured with the scan bar, the location of the calibration element centroid in the accessed image being impacted by the chip gap between the sensor chips in the scan bar;
- measure a size of the chip gap from the accessed image;
- and
- compensate for an estimated positional shift of the calibration element centroid caused by the chip gap through application of at least one of the accessed model and the measured chip gap size to cause the location of the calibration element centroid in the accessed image to more accurately correspond to an actual location of the calibration element centroid on an object from which the accessed image was captured.
Dependencies are inferred from the claim text.