Halide semiconductor memristor and neuromorphic device

A neuromorphic device, comprises:

• a substrate;
• a signal receiving unit, being disposed on the substrate, and comprising a plurality of signal receiving electrodes;
• a plurality of halide semiconductor memristors, being disposed on the substrate, and being respectively used as a plurality of artificial synapses;
• wherein each of the plurality of halide semiconductor memristors comprise a first electrode layer, an active layer formed on the first electrode layer, and a second electrode layer formed on the active layer, and the active layer comprises:
• a first oxide semiconductor film formed on the first electrode layer, having a first conduction band minimum (CBM) level, a first fermi level and a first valence band maximum (VBM) level;
• a halide semiconductor film formed on the first oxide semiconductor film, having a second CBM level, a second fermi level and a second VBM level;
• and
• a second oxide semiconductor film formed on the halide semiconductor film, having a third CBM level, a third fermi level and a third VBM level;
• and
• a signal transmitting unit, being disposed on the substrate, and comprising a plurality of signal transmitting electrodes;
• wherein the halide semiconductor film is made of CsPbIxBry or a hybrid organic-inorganic perovskite material, and x=0.78 and y=0.22;
• wherein both the first oxide semiconductor film and the second oxide semiconductor film are made of a transition metal oxide that is selected from a group consisting of nickel oxide, copper oxide, chromium oxide, molybdenum oxide, tungsten oxide, and vanadium oxide;
• wherein the respective signal receiving electrodes are connected to the respective second electrode layers, and the respective signal transmitting electrodes are connected to the respective first electrode layers;
• wherein an absolute value of the first CBM level of the first oxide semiconductor film is greater than the second CBM level of the halide semiconductor film, an absolute value of the first fermi level of the first oxide semiconductor film being greater than the second fermi level of the halide semiconductor film, and an absolute value of the first VBM level of the first oxide semiconductor film being greater than the second VBM level of the halide semiconductor film, such that a first carrier energy barrier is formed between the first oxide semiconductor film and the halide semiconductor film;
• wherein an absolute value of the third CBM level of the second oxide semiconductor film is greater than the second CBM level of the halide semiconductor film, an absolute value of the third fermi level of the second oxide semiconductor film being greater than the second fermi level of the halide semiconductor film, and an absolute value of the third VBM level of the second oxide semiconductor film being greater than the second VBM level of the halide semiconductor film, such that a second carrier energy barrier is formed between the second oxide semiconductor film and the halide semiconductor film.