Array test apparatus and method
AssigneeSamsung Display Co., Ltd.
InventorsJoon Geol Kim, Si Joon Kim, Hee Seon Kim
Life of this patent
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Abstract
An array test apparatus includes a signal transmission unit which transmits a data signal to each of a plurality of data lines of a low-temperature polysilicon (“LTPS”) substrate, a signal measurement unit which measures the data signal of each of the data lines of the LTPS substrate, a timer which generates a horizontal period for setting a section in which the data signal is transmitted from the signal transmission unit to each of the data lines and a section in which the data signal output from each of the data lines is measured by the signal measurement unit, and a determination unit which determines whether each of the data lines of the LTPS substrate is normal based on the data signal measured by the signal measurement unit.
Claims11
An array test apparatus comprising:
- a signal transmission unit which transmits a data signal to each of a plurality of data lines of a low-temperature polysilicon substrate;
- a signal measurement unit which measures the data signal of each of the plurality of data lines of the low-temperature polysilicon substrate;
- a timer which generates a horizontal period for setting a section in which the data signal is transmitted from the signal transmission unit to each of the plurality of data lines and a section in which the data signal output from each of the plurality of data lines is measured by the signal measurement unit;
- a determination unit which determines whether each of the plurality of data lines of the low-temperature polysilicon substrate is normal based on the data signal measured by the signal measurement unit;
- a transmission probe which delivers a data signal transmitted from the signal transmission unit to each of the plurality of data lines;
- and
- a measurement probe which delivers the data signal measured in each of the plurality of data lines to the signal measurement unit,
- wherein the transmission probe and the measurement probe are placed above the plurality of data lines of the low-temperature polysilicon substrate to perform an array test.
An array test apparatus comprising:
- a signal transmission unit which transmits a data signal to each of a plurality of data lines of a low-temperature polysilicon substrate;
- a signal measurement unit which measures the data signal of each of the plurality of data lines of the low-temperature polysilicon substrate;
- a timer which generates a horizontal period for setting a section in which the data signal is transmitted from the signal transmission unit to each of the plurality of data lines and a section in which the data signal output from each of the plurality of data lines is measured by the signal measurement unit;
- and
- a determination unit which determines whether each of the plurality of data lines of the low-temperature polysilicon substrate is normal based on the data signal measured by the signal measurement unit,
- wherein the signal transmission unit transmits data signals in a first section of the horizontal period, and the signal measurement unit measures the data signals in a section remaining after the first section is excluded from the horizontal period.
Dependencies are inferred from the claim text.