Power semiconductor apparatus and manufacturing method therefor
AssigneeMitsubishi Electric Corporation
InventorsHiroshi Kawashima, Takamasa Iwai, Taketoshi Shikano, Satoshi Kondo, Ken Sakamoto
Life of this patent
Estimating the term…
Loading patent…
AssigneeMitsubishi Electric Corporation
InventorsHiroshi Kawashima, Takamasa Iwai, Taketoshi Shikano, Satoshi Kondo, Ken Sakamoto
Estimating the term…
A lead frame (4) includes an inner lead (5), an outer lead (2) connected to the inner lead (5), and a power die pad (7). A power semiconductor device (9) is bonded onto the power die pad (7). A first metal thin line (11) electrically connects the inner lead (5) and the power semiconductor device (9). Sealing resin (1) seals the inner lead (5), the power die pad (7), the power semiconductor device (9), and the first metal thin line (11). The sealing resin (1) includes an insulating section (15) directly beneath the power die pad (7). A thickness of the insulating section (15) is 1 to 4 times a maximum particle diameter of inorganic particles in the sealing resin (1). A first hollow (14) is provided on an upper surface of the sealing resin (1) directly above the power die pad (7) in a region without the first metal thin line (11) and the power semiconductor device (9).
A power semiconductor apparatus comprising:
A manufacturing method for a power semiconductor apparatus comprising:
Dependencies are inferred from the claim text.