US 11,107,667 B1 · Dual polarity ion management

Abstract

A mass spectrometer includes an ion source configured to ionize a sample to produce ions; a mass analyzer configured to separate the ions based on their mass-to-charge ratio; a detector configured to detect ions; an ion optics component configured to direct ions along at least part of the path from the ion source to the mass analyzer to the detector; and a controller. The controller is configured to switch the source at a first time from a first polarity source voltage to a second polarity source voltage; and switch the detector or the ion optics component at a second time from a first voltage to a second voltage, the second time being offset from the first time, the first voltage being the first polarity detector voltage or the first polarity ion optics voltage and the second voltage being the second polarity detector voltage or the second polarity ion optics voltage.

Claims20

Dependent claims

A mass spectrometer, comprising:

an ion source configured to ionize a sample to produce ions;
a mass analyzer configured to separate the ions based on their mass-to-charge ratio;
a detector configured to detect ions;
an ion optics component configured to direct ions along at least part of the path from the ion source to the mass analyzer to the detector;
and
a controller configured to
switch the source at a first time from a first polarity source voltage to a second polarity source voltage;
and
switch the detector or the ion optics component at a second time from a first voltage to a second voltage, the second time being offset from the first time, the first voltage being a first polarity detector voltage or a first polarity ion optics voltage and the second voltage being a second polarity detector voltage or a second polarity ion optics voltage.

6 more elements

Dependencies are inferred from the claim text.

Dual polarity ion management

Life of this patent

Dual polarity ion management

Life of this patent

Abstract

Claims20