Leveraging chip variability
AssigneeMicrosoft Technology Licensing, LLC
InventorsBenjamin Zorn, Ray Bittner, Darko Kirovski, Karthik Pattabiraman
Life of this patent
Estimating the term…
Loading patent…
AssigneeMicrosoft Technology Licensing, LLC
InventorsBenjamin Zorn, Ray Bittner, Darko Kirovski, Karthik Pattabiraman
Estimating the term…
Embodiments are described that leverage variability of a chip. Different areas of a chip vary in terms of reliability under a same operating condition. The variability may be captured by measuring errors over different areas of the chip. A physical factor that affects or controls the likelihood of an error on the chip can be varied. For example, the voltage supplied to a chip may be provided at different levels. At each level of the physical factor, the chip is tested for errors within the regions. Some indication of the error statistics for the regions is stored and then used to adjust power used by the chip, to adjust reliability behavior of the chip, to allow applications to control how the chip is used, to compute a signature uniquely identifying the chip, etc.
A method performed by a memory device, the method comprising:
A chip comprising:
A method of operating a memory chip, the method comprising:
Dependencies are inferred from the claim text.