Light inspection system and method of the surface and inside of a sample

A light inspection system of the surface and inside of a sample, the system comprising:

• a light source configured to generate a light beam having a broadband spectrum at a given optical power to impinge on a sample located at a given distance, said sample comprising a given translucency and absorption coefficients;
• a light capturing unit;
• an imaging system configured to obtain an image of said sample upon said impingement, said imaging system comprising a parabolic mirror with a hole, said parabolic mirror allowing:
• the passage of the light beam towards the sample via the hole,
• the redirection of a scattered light component of the sample towards said light capturing unit, and
• the elimination of the light coming from direct reflection at the sample through said hole;
• said light capturing unit including a bundle of bifurcated fibers comprising a central fiber and at least one external fiber, said central fiber being positioned to receive scattered light at least from the surface of the sample and said at least one external fiber being positioned at a given distance from the central fiber to receive scattered light exclusively from inside the sample;
• and
• a measuring system configured to measure a power and/or a spectrum collected independently in the central fiber and in the at least one external fiber,
• wherein said image of the sample being obtained at a traversal plane of the bundle of bifurcated fibers.