Method of processing substrate, device manufacturing method, and plasma processing apparatus
AssigneeTokyo Electron Limited
InventorsYusuke Aoki, Toshikatsu Tobana, Shinya Morikita, Satoru Nakamura
Life of this patent
Estimating the term…
Loading patent…
AssigneeTokyo Electron Limited
InventorsYusuke Aoki, Toshikatsu Tobana, Shinya Morikita, Satoru Nakamura
Estimating the term…
A disclosed method of processing a substrate includes (a) providing a substrate in a chamber of a plasma processing apparatus. The substrate has a patterned organic mask. The method further includes (b) generating plasma from a processing gas in the chamber in a state where the substrate is accommodated in the chamber. The method further includes (c) periodically applying a pulsed negative direct-current voltage to an upper electrode of the plasma processing apparatus, during execution of the generating plasma (that is, the above (b)). In the applying a pulsed negative direct-current voltage, ions from the plasma are supplied to the upper electrode, so that a silicon-containing material which is released from the upper electrode is deposited on the substrate.
A method of processing a substrate comprising:
Dependencies are inferred from the claim text.