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US 11,081,201 B2Granted
Parallel test device
AssigneeWinbond Electronics Corp.
InventorChan-Seok Park
Life of this patent
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Abstract
A parallel test device is provided. The parallel test device of the disclosure includes an I/O pad, a plurality of input buffers, and a plurality of output drivers. The I/O pad is configured to perform input/output operations in the parallel test device. The input buffers are configured to enable write data. The output drivers are configured to enable read data and output the read data to the I/O pad. A test signal corresponds to the data from an external device is transferred to the output drivers through the I/O pad in the parallel test device during a test mode.
Claims13
A parallel test device comprising:
- an I/O pad, configured to perform input/output operations in the parallel test device;
- a plurality of input buffers, configured to enable write data;
- and
- a plurality of output drivers, configured to enable read data and output the read data to the I/O pad;
- wherein a test signal corresponding to a data from an external device is transferred to the output drivers through the I/O pad in the parallel test device during a test mode.
2 more elements
Dependencies are inferred from the claim text.