Memory, information processing system, and method of controlling memory
AssigneeSony Corporation
InventorHaruhiko Terada
Life of this patent
Estimating the term…
Loading patent…
AssigneeSony Corporation
InventorHaruhiko Terada
Estimating the term…
Reliability of stored data is improved without increasing power consumption in a case where a threshold of a control element in a memory cell changes. In a memory including the memory cell, a reference cell, and an access control unit, the memory cell changes from a non-conduction state to a conduction state according to an applied voltage at a threshold voltage and changes to a high resistance state and a low resistance state according to the voltage applied in the conduction state. The reference cell changes from a non-conduction state to a conduction state at a reference threshold voltage according to an applied voltage. The access control unit estimates that the reference threshold voltage measured in the reference cell is the threshold voltage of the memory cell and applies a voltage to the memory cell when accessing the memory cell.
A memory comprising:
A method of controlling a memory, the method comprising:
Dependencies are inferred from the claim text.