Appearance inspection system, image processing device, imaging device, and inspection method
AssigneeOMRON Corporation
InventorsYutaka Kato, Yasuhito Uetsuji
Life of this patent
Estimating the term…
Loading patent…
AssigneeOMRON Corporation
InventorsYutaka Kato, Yasuhito Uetsuji
Estimating the term…
An appearance inspection system includes a setting part, a movement mechanism, and a control part. The setting part sets a route passing through a plurality of imaging positions in order. The setting part sets the route so that a first time necessary for the movement mechanism to move an imaging device from a first imaging position to a second imaging position among the plurality of imaging positions is longer than a second time necessary for a process of changing a first imaging condition corresponding to the first imaging position to a second imaging condition corresponding to the second imaging position by the control part. The control part starts the process of changing the first imaging condition to the second imaging condition earlier by the second time or more than a scheduled time at which the imaging device arrives at the second imaging position.
An appearance inspection system that performs appearance inspection by imaging a target at a plurality of imaging positions set for the target, the appearance inspection system comprising:
An inspection method of performing appearance inspection by imaging a target at a plurality of imaging positions set for the target using an imaging device while moving the imaging device using a movement mechanism,
Dependencies are inferred from the claim text.
Drawings are temporarily unavailable. Open the PDF at USPTO
From the US filing history. Foreign family members aren’t listed.
No references of this kind are recorded.
Image analysis: inspection of images, e.g. flaw detection
Program controls: characterised by the control system, structure, architecture
Characterised by programming, planning systems for manipulators: characterised by motion, path, trajectory planning
Program controls: characterised by the tasks executed
About 12 years 6 months of term left · ends 13 Apr 2039 (estimated)
This application claims the priority of Japan patent application serial no. 2018-044035, filed on Mar. 12, 2018. The entirety of the above-mentioned patent application is hereby incorporated by reference herein and made a part of this specification.
The disclosure relates to an appearance inspection system inspecting a target using a captured image and an image processing device, an imaging device, and an inspection method used in the appearance inspection system.
Many appearance inspection systems inspecting targets such as resins, metals, and the like using image processing technologies have been proposed.
FIG. 1 is a schematic view illustrating an overview of an appearance inspection system according to an embodiment.
FIG. 2 is a diagram illustrating an example of an internal configuration of an imaging device.
FIG. 3 is a diagram illustrating an example of a designation route set by an information processing device.
An objective of the disclosure is to provide an appearance inspection system capable of shortening an inspection time at the time of imaging of a target from a plurality of imaging positions and an image processing device, an imaging device, and an inspection method used in the appearance inspection system.
According to the example of the disclosure, when the imaging device arrives at the imaging position, the imaging condition of the imaging device is changed to the imaging condition corresponding to the imaging position simultaneously or before the arrival. Therefore, when the imaging device arrives at the imaging position, the imaging by the imaging device can be performed instantly. As a result, it is possible to shorten the inspection time when the target is imaged from the plurality of imaging positions.
According to the above-described example of the disclosure, the appearance inspection system may further include an estimation part that estimates the second time based on pre-decided information indicating a correlation between an imaging condition before a change and an imaging condition after the change, and a time necessary for a process of changing the imaging condition before the change to the imaging condition after the change. According to the example of the disclosure, it is possible to easily estimate the second time based on the information indicating the correlation.