Method and device for predicting operation parameter of integrated circuit

A device for predicting an operation parameter of an integrated circuit, comprising:

• a providing device, configured to provide a plurality of cells used by the integrated circuit;
• a testing device, coupled to the providing device, and configured to obtain the cells, provide a test model comprising a first timing component and a second timing component and configure each of the cells to couple between the first timing component and the second timing component, and perform a voltage-frequency sweep test on each of the cells through the test model to obtain an operation time of each of the cells and normalize the operation time of each of the cells to generate a plurality of parameters, wherein the parameters correspond to a voltage value and the operation time is a time from an output terminal of the first timing component generating an output signal to an input terminal of the second timing component receiving an input signal;
• a processing device, coupled to the testing device, and configured to obtain the parameters, establish a lookup table according to the parameters, obtain a timing signoff corresponding to the integrated circuit, perform a timing analysis on a plurality of timing paths of the integrated circuit according to the timing signoff and the parameters of the lookup table to obtain a critical timing path, and predict the operation parameter of the integrated circuit according to the critical timing path.