# US 11,079,407 B2 · Probe attenuator for reduced input capacitance > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 11,079,407 B2 - Document ID: US11079407B2 - Status: Granted - Kind: B2 - Application number: 15/842,654 - Filed: 2017-12-14 - Published: 2019-01-10 - Granted: 2021-08-03 - Earliest claimed: 2017-07-10 - Assignees: Tektronix, Inc. - Applicants: Tektronix, Inc. - Inventors: Jonathan S. Dandy - Web page: https://patentgrep.com/patent/US11079407B2 ## CPC - G01R 1/06766: {Input circuits therefor} - G01R 1/06772: {High frequency probes} - G01R 1/44: Modifications of instruments for temperature compensation - G01R 35/00: Testing or calibrating of apparatus covered by the other groups of this subclass - G01R 35/005: {Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references (G01R33/0035, G01R35/002 take precedence)} - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) ## Abstract Disclosed is a test and measurement probe including a signal channel having an input series resistor with a series parasitic capacitance. The probe also includes an amplifier coupled to the signal channel. The amplifier includes a shunt parasitic capacitance. A variable shunt resistor is coupled to the signal channel and a ground. The variable shunt resistor can be set to match a resistance capacitance (RC) value associated with the series parasitic capacitance and the shunt. The probe can also include a variable series resistor coupled to the amplifier. The variable series resistor can be set to adjust for attenuation variation associated with the variable shunt resistor. Other embodiments may be described and/or claimed herein. ## Claims ### Claim 1 A test and measurement probe comprising: a signal input configured to receive a test signal; a variable series resistor coupled to an input of a test system; a signal amplifier within the probe having a signal output coupled to the variable series resistor; and a voltage divider circuit coupled between the signal input and the signal amplifier through a signal channel, the voltage divider circuit including a signal channel portion having an RC time constant and a shunt portion having an RC time constant, the shunt portion including a variable shunt resistor, wherein the resistance of the variable shunt resistor is selected so that the RC time constant of the shunt portion of the voltage divider circuit matches the RC time constant of the signal channel portion of the voltage divider circuit. ### Claim 2 (depends on 1) The test and measurement probe of claim 1, wherein the voltage divider circuit does not include a shunt capacitor. ### Claim 3 (depends on 1) The test and measurement probe of claim 1, wherein the voltage divider circuit includes a shunt electrostatic sensitive device (ESD) diode. ### Claim 4 (depends on 1) The test and measurement probe of claim 1, wherein the voltage divider circuit includes a shunt diode. ### Claim 5 (depends on 4) The test and measurement probe of claim 4, wherein the shunt diode is a biased varactor diode. ### Claim 6 (depends on 4) The test and measurement probe of claim 4, further comprising: a temperature sensor; and a conditioning circuit coupled to the temperature sensor and the shunt diode, the conditioning circuit configured to bias the shunt diode based on temperature. ### Claim 7 A test and measurement probe comprising: a signal channel including an input series resistor with a series parasitic capacitance; an amplifier within the probe coupled between the signal channel and an output of the probe, the amplifier including a shunt parasitic capacitance; a variable shunt resistor coupled between the signal channel and a ground, the variable shunt resistor set to reduce a voltage across the signal channel and match a resistance capacitance (RC) value associated with the series parasitic capacitance and input series resistor and the shunt parasitic capacitance and variable shunt resistor; and a variable series resistor coupled between the output of the amplifier and the output of the probe, the variable series resistor set to adjust for attenuation variation associated with the variable shunt resistor. ### Claim 8 (depends on 7) The test and measurement probe of claim 7, wherein the variable shunt resistor and the input series resistor act as a voltage divider circuit, and the voltage divider circuit does not include a shunt capacitor. ### Claim 9 (depends on 8) The test and measurement probe of claim 8, wherein the test and measurement probe applies a loading capacitance to a Device Under Test (DUT) via the signal channel, and wherein the loading capacitance is reduced by omission of the shunt capacitor from the voltage divider circuit. ### Claim 10 (depends on 7) The test and measurement probe of claim 7, further comprising a shunt electrostatic sensitive device (ESD) diode coupled to the signal channel, the ESD diode to protect the amplifier from electrostatic discharge across the signal channel. ### Claim 11 (depends on 10) The test and measurement probe of claim 10, wherein the ESD diode includes a temperature varying capacitance that offsets a temperature varying capacitance associated with the shunt parasitic capacitance of the amplifier. ### Claim 12 (depends on 7) The test and measurement probe of claim 7, further comprising a shunt diode coupled to the signal channel and the ground, the shunt diode biased to support matching the RC value associated with the series parasitic capacitance and the shunt parasitic capacitance. ### Claim 13 (depends on 12) The test and measurement probe of claim 12, wherein the shunt diode is a varactor diode. ### Claim 14 (depends on 12) The test and measurement probe of claim 12, further comprising: a temperature sensor to measure temperature; and a conditioning circuit coupled to the temperature sensor and the shunt diode, the conditioning circuit configured to bias the shunt diode based on the temperature. ### Claim 15 A method of calibrating a test and measurement probe comprising: setting a variable shunt resistor in a voltage divider circuit of the test and measurement probe to flatten a frequency response of the test and measurement probe; and setting a variable series resistor in a signal channel of the test and measurement probe to mitigate attenuation variation associated with the variable shunt resistor setting, wherein flattening the frequency response of the test and measurement probe results in matching a resistance capacitance (RC) value associated with resistance and parasitic capacitances associated with the voltage divider circuit and an amplifier of the test and measurement probe. ### Claim 16 (depends on 15) The method of claim 15, further comprising setting a bias of a shunt diode in the voltage divider circuit to mitigate temperature varying capacitance of the test and measurement probe. ### Claim 17 (depends on 15) The method of claim 15, wherein setting the variable shunt resistor to flatten the frequency response of the test and measurement probe does not include adjusting a variable capacitor. ### Claim 18 (depends on 15) The method of claim 15, wherein the voltage divider circuit does not include a shunt capacitor. ### Claim 19 (depends on 15) The method of claim 15, wherein the voltage divider circuit includes a shunt electrostatic sensitive device (ESD) diode with a temperature varying capacitance that offsets a temperature varying capacitance associated with an amplifier of the test and measurement probe.