Temperature dependent x-ray fluorescence
AssigneesNational Technology & Engineering Solutions of Sandia, LLC, Purdue Research Foundation
InventorsKathryn N. Gabet Hoffmeister, Enrico C. Quintana, Walter Gill, Steven F. Son, Eric R. Westphal
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Abstract
A method and system for determining temperature are provided. The method comprises using an x-ray source to irradiate a sample of a material with x-rays. Photon fluorescence produced by the sample in response to the x-ray irradiation is detected by a number of photon detectors. Based on the detected fluorescence a temperature of the sample is determined according to a predetermined relationship between photon fluorescence and temperature for the material.
Claims21
A method of determining temperature, the method comprising:
- irradiating, by an x-ray source, a sample of a material with x-rays;
- detecting, by a number of photon detectors, photon fluorescence produced by the sample in response to the x-ray irradiation;
- and
- determining, by a number of processors, a temperature of the sample according to a predetermined relationship between photon fluorescence and temperature for the material.
A system for determining temperature, the system comprising:
- an x-ray source;
- a number of photon detectors;
- a number of processors in communication with the x-ray source and photon detectors, wherein the number of processors are configured to execute program instructions to:
- irradiate, with the x-ray source, a sample of a material;
- detect, with the photon detectors, photon fluorescence produced by the sample in response to the x-ray irradiation;
- and
- determining a temperature of the sample according to a predetermined relationship between photon fluorescence and temperature for the material.
Dependencies are inferred from the claim text.