ID chip socket for test connector assembly, test connector assembly including ID chip socket, and test equipment set including test connector assembly
AssigneeIsc Co., Ltd.
InventorYoung Bae Chung
Life of this patent
Estimating the term…
Abstract
An ID chip socket according to an embodiment disclosed herein includes: a contactor configured to be fixed to an upper side of the frame; a socket-conductive part penetrating the contactor in a vertical direction and configured to enable electrical connection in the vertical direction; an ID chip fixed to an upper side of the socket-conductive part and electrically connected to the socket-conductive part; and a cover configured to cover an upper surface of the ID chip and to be fixed to at least one of the contactor and the frame.
Claims20
An ID (identification) chip socket fixed to a frame that supports a connector of a test connector assembly, the ID chip socket comprising:
- a contactor configured to be fixed to an upper side of the frame;
- a socket-conductive part penetrating the contactor in a vertical direction and configured to enable electrical connection in the vertical direction;
- an ID chip fixed to an upper side of the socket-conductive part and electrically connected to the socket-conductive part;
- and
- a cover configured to cover an upper surface of the ID chip and to be fixed to at least one of the contactor and the frame.
A test connector assembly disposed between a device to be inspected and test equipment to electrically connect the device to be inspected and the test equipment to each other, the test connector assembly comprising:
- a frame supporting a connector for testing;
- and
- an ID chip socket fixed to an upper side of the frame,
- wherein the ID chip socket comprises:
- a contactor fixed to the upper side of the frame;
- a socket-conductive part penetrating the contactor in a vertical direction and configured to enable electrical connection in the vertical direction;
- an ID chip fixed to an upper side of the socket-conductive part and electrically connected to the socket-conductive part;
- and
- a cover configured to cover an upper surface of the ID chip and fixed to at least one of the contactor and the frame.
A test equipment set comprising:
- a test equipment;
- and
- a test connector assembly disposed between a device to be inspected and the test equipment to electrically connect the device to be inspected and the test equipment to each other,
- wherein the test connector assembly further comprises:
- a frame supporting a connector for testing;
- and
- an ID chip socket fixed to an upper side of the frame,
- wherein the ID chip socket comprises:
- a contactor fixed to the upper side of the frame;
- a socket-conductive part penetrating the contactor in a vertical direction and configured to enable electrical connection in the vertical direction, the socket-conductive part having a lower end brought into contact with the test equipment;
- an ID chip fixed to an upper side of the socket-conductive part and electrically connected to the socket-conductive part;
- and
- a cover configured to cover an upper surface of the ID chip and fixed to at least one of the contactor and the frame, and
- wherein the ID chip is configured to execute at least one of an identification function of identifying at least one of the device to be inspected and the test connector assembly and a history management function of tracking a history of the ID chip socket, by receiving an electrical signal from the test equipment or sending an electrical signal to the test equipment.
Dependencies are inferred from the claim text.