Parallel trigger model for test and measurement instruments
AssigneeKeithley Instruments, LLC
InventorsBrian P. Frackelton, George J. Polly
Life of this patent
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Abstract
A test and measurement instrument for performing multiple operations, including a port to receive a signal from a device under test; and a processor. The processor configured to, based on a parallel trigger model, execute a first process associated with first functionality of the test and measurement instrument, and execute a second process on the signal from the device under test, the second process associated with second functionality of the test and measurement instrument. The second process commencing prior to completion of the first process.
Claims19
A test and measurement instrument, comprising:
- a port to receive a signal from a device under test;
- an input configured to receive a parallel trigger model, the parallel trigger model including a procedure for performing a first process and a second process in parallel;
- and
- a processor configured to, based on the parallel trigger model:
- detect whether the parallel trigger model includes an overlap between the first process and the second process,
- generate an error message in response to detecting the overlap,
- when the overlap is not detected, execute the first process to cause a first functionality of the test and measurement instrument to be performed, and
- when the overlap is not detected, execute the second process to cause a second functionality of the test and measurement instrument to be performed on the signal, the second process commencing prior to a completion of the first process.
A method for performing first and second functionality of a test and measurement instrument, the method comprising:
- receiving a parallel trigger model including a procedure for performing a first process and a second process in parallel;
- detecting whether the parallel trigger model includes an overlap between the first process and the second process,
- generating an error message in response to detecting the overlap,
- receiving a signal from a device under test;
- when the overlap is not detected, based on the parallel trigger model, performing a first process associated with a first functionality, from a start time to an end time;
- and
- when the overlap is not detected, based on the parallel trigger model, performing a second process, associated with a second functionality, on the signal, the second process beginning prior to the end time of the first process.
A non-transitory computer readable storage medium having instructions stored thereon that, when executed by a processor of a test and measurement instrument, cause the test and measurement instrument to:
- receive a parallel trigger model including a procedure for performing a first type of operation and a second type of operation in concert;
- detect whether the parallel trigger model includes an overlap between the first process and the second process;
- generate an error message in response to detecting the overlap;
- when the overlap is not detected, configure a first set of components associated with a first functionality of the test and measurement instrument to perform a first type of operation based on the parallel trigger model;
- when the overlap is not detected, configure, concurrently with the configuration of the first set of components, a second set of components associated with a second functionality of the test and measurement instrument to perform the second type of operation based on the parallel trigger model;
- and
- perform the first type of operation and the second type of operation in concert based on the parallel trigger model.
Dependencies are inferred from the claim text.