Method and system for testing antenna array using middle field antenna pattern
AssigneeKeysight Technologies, Inc.
InventorsYa Jing, Hong-Wei Kong, Zhu Wen
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AssigneeKeysight Technologies, Inc.
InventorsYa Jing, Hong-Wei Kong, Zhu Wen
Estimating the term…
A method is provided for testing an antenna array of a DUT using a probe antenna, the antenna array including multiple antenna elements. The method includes providing a correction table that includes predetermined correction data of differences between far field antenna patterns from different positions in a far field of the antenna array and a middle field antenna pattern from a position in a middle field of the antenna array, where the middle field satisfies near field criteria for the antenna array and satisfies far field criteria for each antenna element in the antenna array; measuring an antenna pattern at a first position in the middle field of the antenna array; retrieving predetermined correction data from the correction table corresponding to a second position located in the far field of the antenna array; and translating the measured antenna pattern to the far field by adding the retrieved predetermined correction data.
A method for testing an antenna array of a device under test (DUT) using a probe antenna for receiving a radio frequency (RF) signal beam from the antenna array, the antenna array comprising a plurality of antenna elements, the method comprising:
A method for testing an antenna array of a device under test (DUT) using a probe antenna for receiving a radio frequency (RF) signal beam from the antenna array, the antenna array comprising a plurality of antenna elements, the method comprising:
A test system for determining an antenna pattern of an antenna array of a device under test (DUT), the antenna array comprising a plurality of antenna elements, the test system comprising:
Dependencies are inferred from the claim text.