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US 11,056,424 B2Granted
Display device
AssigneeSamsung Display Co., Ltd.
InventorsKyung Mok Lee, Dae Geun Lee
Life of this patent
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Abstract
A display device including a display panel having panel pad units including a first panel pad unit having first pads arranged in a first column and a second panel pad unit having second pads arranged in a second column; a first member coupled to at least one of the first and second panel pad units; and a second member coupled to the first member and including a plurality of test pads, and wherein the first member includes lines electrically connecting a respective one of the plurality of test pads with a respective one of the first and second pads.
Claims17
A display device comprising:
- a display panel having panel pad units including a first panel pad unit having first pads arranged in a first column and a second panel pad unit having second pads arranged in a second column;
- a first member coupled to at least one of the first and second panel pad units;
- and
- a second member coupled to the first member and including a plurality of test pads, and
- wherein the first member comprises lines electrically connecting a respective one of the plurality of test pads with a respective one of the first and second pads,
- wherein the first panel pad unit comprises a first panel inspection pad, a second panel inspection pad and a third panel inspection pad, and wherein the second panel pad unit comprises a fourth panel inspection pad, a fifth panel inspection pad and a sixth panel inspection pad, and wherein:
- the first panel inspection pad, the second panel inspection pad and the third panel inspection pad are connected to a first panel line, and
- the fourth panel inspection pad, the fifth panel inspection pad and the sixth panel inspection pad are connected to a second panel line.
5 more elements
A display device comprising:
- a display panel having a plurality of test pads;
- an integrated circuit to drive the display panel;
- a connector electrically communicating the display panel and the integrated circuit;
- a first test pad of the plurality of test pads being connected to a first constant current source, a second test pad of the plurality of test pads being connected to a first ground contact portion, a third test pad of the plurality of test pads comprises a first voltage measurement portion, and a fourth test pad of the plurality of test pads comprises a second voltage measurement portion,
- panel pad units comprising a first panel pad unit having first pads arranged in a first column, and a second panel pad unit having second pads arranged in a second column, the first panel pad unit further comprises a first panel dummy pad, and wherein the second panel pad unit further comprises a second panel dummy pad, the first panel dummy pad being disposed adjacent to a panel inspection pad comprising a first panel inspection pad, a second panel inspection pad, a third panel inspection pad, and a fourth panel inspection pad, and wherein:
- the second panel dummy pad is disposed adjacent to the fourth panel inspection pad,
- the first panel inspection pad, the second panel inspection pad, the third panel inspection pad, and the fourth panel inspection pad are connected to one another through panel lines.
4 more elements
Dependencies are inferred from the claim text.