Read disturb scan consolidation

A method comprising:

• identifying a first memory unit on a first plane of a plurality of planes of a memory device, wherein a first metric for the first memory unit satisfies a first threshold criterion;
• identifying a second memory unit on a second plane of the plurality of planes, wherein a second metric for the second memory unit satisfies a second threshold criterion and does not satisfy the first threshold criterion;
• and
• reading data from the first memory unit and the second memory unit together as part of a multi-plane data integrity operation to determine whether a reliability statistic of either the first memory unit or the second memory unit satisfies an error correction capability of the memory device.

A non-transitory computer-readable storage medium comprising instructions that, when executed by a processing device, cause the processing device to:

• determine that a first metric of a first memory unit on a first plane of a memory device satisfies a first threshold criterion;
• determine whether a second metric of a second memory unit on a second plane of the memory device satisfies a second threshold criterion and does not satisfy the first threshold criterion;
• and
• responsive to the second metric satisfying the second threshold criterion and not satisfying the first threshold criterion, perform a multi-plane data integrity operation to determine a first reliability statistic for the first memory unit and a second reliability statistic for the second memory unit in parallel.