Word line pulse width control circuit in static random access memory
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsAnjana Singh, Cheng Hung Lee, Hau-Tai Shieh, Yi-Tzu Chen
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsAnjana Singh, Cheng Hung Lee, Hau-Tai Shieh, Yi-Tzu Chen
Estimating the term…
Devices and methods are provided for word line pulse width control for a static random access memory (SRAM) devices. A control circuit includes a first transistor, an inverter coupled to the first transistor, and a second transistor comprising a gate, a first source/drain terminal and a second source/drain terminal. The second transistor is coupled to the inverter. The first source/drain terminal of the second transistor is coupled in series to the first transistor. The second source/drain terminal is coupled to a decoder driver circuit. The second transistor is configured to charge a load of a common decoder line so as to reduce an effective load of the decoder driver circuit.
A control circuit for minimizing a static noise margin of a static random access memory device comprising:
A static random access memory (SRAM) device comprising:
A method in a static random access memory (SRAM) device comprising:
Dependencies are inferred from the claim text.