Optimized scan interval

A system comprising:

• a processing circuit;
• a memory device to receive commands to read from and write to memory cells of an array of memory cells of the memory device;
• one or more trackers to monitor parameters comprising a selected time interval, a number of read operations to read at least a portion of the memory device, and a number of at least one of write operations and erase operations to the at least the portion of the memory device;
• firmware having stored instructions, executable by the processing circuit, to perform first operations comprising an operation to trigger a read calibration of the memory device based on a determination of an occurrence of at least one event, the determination being based on inputs from the one or more trackers;
• and
• management firmware having stored instructions, executable by the processing circuit, to perform second operations comprising an operation to direct a management task of the memory device.

A method comprising:

• monitoring, using one or more trackers, parameters comprising a selected time interval, a number of read operations to read at least a portion of the memory device, and a number of at least one of write operations and erase operations to the at least the portion of the memory device;
• determining an occurrence of at least one event based on inputs from the one or more trackers;
• and
• triggering a read calibration of the memory device based on the determining the occurrence of the at least one event.