Testing resistance of a circuit to a side channel analysis
AssigneeEshard
InventorsBenoît Feix, Hugues Thiebeauld de la Crouee
Life of this patent
Estimating the term…
Loading patent…
AssigneeEshard
InventorsBenoît Feix, Hugues Thiebeauld de la Crouee
Estimating the term…
In a general aspect, a test method can include: acquiring a plurality of value sets, each comprising values of a physical quantity or of logic signals, linked to the activity of a circuit to be tested when executing distinct cryptographic operations applied to a same secret data, for each value set, counting occurrence numbers of the values of the set, for each operation and each of the possible values of a part of the secret data, computing a partial result of operation, computing sums of occurrence numbers, each sum being obtained by adding the occurrence numbers corresponding to the operations which when applied to a same possible value of the part of the secret data, provide a partial operation result having a same value, and analyzing the sums of occurrence numbers to determine the part of the secret data.
A test method comprising:
A system for testing a circuit, the system comprising:
A non-transitory computer readable medium carrying one or more sequences of instructions, which, when executed by one or more processors, cause the one or more processors to:
Dependencies are inferred from the claim text.