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AssigneeJohnstech International Corporation
InventorsDavid Johnson, Michael Andres, Neil Graf, Kenna Pretts
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This disclosure relates to a method of fabrication contact pins 24 used in testing circuit components, typically integrated circuits and the contact pins themselves. It is desirable to selectively radius certain portions of each pin to achieve desired performance of the entire pin. The portion to be radiused is cut to the desire shaped from a blank material. The portion which is not to be radiused is not cut to its final shape from the blank but to a larger shape which includes the material for the final shape. The entire cut portion is then treated to shape tor round all exposed edges. Then the remaining portion of the pin is cut out from the larger blank area which was previously retained, leaving those portions with non-radiused edged.
A method of making planar contacts pins for use in integrated circuit testing where said pins have sidewalls which join at edges which are initially sharp edges and which some of the edges are then selectively radiused comprising the steps of:
A method of making contact pins for use in integrated circuit testing where said pins have sidewalls which join at edges which are initially sharp edges and which some of the edges are then selectively radiused comprising the steps of:
A method of making planar contact pins for use in integrated circuit testing where said pins have sidewalls which join at edges which are initially sharp edges and which some of the edges are then selectively radiused comprising the steps of:
Dependencies are inferred from the claim text.