Charged particle irradiation apparatus

A charged particle irradiation apparatus comprising:

• a focusing magnet that deflects a charged particle beam to continuously change an irradiation angle of the charged particle beam to an isocenter;
• an irradiation nozzle that continuously moves along a shape on an exit side of an effective magnetic field region of the focusing magnet, wherein a charged particle beam exiting the focusing magnet is emitted to the isocenter through the irradiation nozzle;
• a power supply rail provided so as to extend along the shape along the exit side of the effective magnetic field region;
• and
• a collector shoe fixed to the irradiation nozzle via a support member and configured to slide on the power supply rail to supply power from the power supply rail to the irradiation nozzle,
• wherein a surface of the collector shoe contacted with the power supply rail has the same bend radius as the power supply rail or an average bend radius of the power supply rail, and/or
• wherein the collector shoe slides along the power supply rail while being in contact with a flat side surface of the power supply rail.