Determining a thickness of a region of wall- or plate-like structure
AssigneeGuided Ultrasonics Ltd
InventorTomasz Pialucha
Life of this patent
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Abstract
A method of determining a thickness of a region of wall- or plate-like structure which is thinner than a thickness of a surrounding region of the structure due to a cavity in the structure is disclosed. The method comprises comparing a measured time-frequency dispersion map for at least one dispersive guided wave obtained by measuring the structure using guided waves with a reference time-frequency dispersion map obtained by modelling the structure, determining a cut-off frequency, fc, at which the measured time-frequency dispersion map and the reference time-frequency dispersion map differ and calculating the thickness of the thinner region in dependence upon the cut-off frequency.
Claims16
A method of determining a thickness of a region of a wall- or plate-like structure which is thinner than a thickness of a surrounding region of the structure due to a cavity in the structure, the method comprising:
- comparing a measured time-frequency dispersion map for at least one dispersive guided wave obtained by measuring the structure using guided waves with a reference time-frequency dispersion map obtained by modelling the structure;
- determining a split frequency at which the measured time-frequency dispersion map and the reference time-frequency dispersion map differ;
- and
- calculating the thickness of the thinner wall thickness region in dependence upon the split frequency.
A computer system comprising memory and at least one processor, the at least one processor configured to compare a measured time-frequency dispersion map for at least one dispersive guided wave obtained by measuring a structure using guided waves with a reference time-frequency dispersion map obtained by modelling the structure, to determine a cut-off frequency at which the measured time-frequency dispersion map and the reference time-frequency dispersion map differ and to calculate a thickness of a thinner region in dependence upon the cut-off frequency.
Dependencies are inferred from the claim text.