Air scattering standard for light scattering based optical instruments and tools
AssigneeKLA Corporation
InventorsFrank Li, Qing Li, Zhiwei Xu
Life of this patent
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AssigneeKLA Corporation
InventorsFrank Li, Qing Li, Zhiwei Xu
Estimating the term…
An inspection system utilizing an air scatter standard includes one or more illumination sources to generate a beam of illumination, illumination optics configured to focus the beam of illumination into a volume of air contained within a chamber of an inspection chamber, one or more collection optics configured to collect a portion of illumination scattered from the volume of air, a detector configured to receive the collected portion of illumination from the one or more collection optics, a controller including one or more processors, communicatively coupled to the detector, configured to execute a set of program instructions to receive one or more signals from the detector and determine a state of the beam of illumination at one or more times based on a comparison between at least one of the intensity or polarization of the illumination scattered from the volume of air and a predetermine air scatter standard.
An inspection system comprising:
A method comprising:
An inspection system comprising:
An inspection system comprising:
Dependencies are inferred from the claim text.