Sensing devices, sensors, and methods for monitoring environmental conditions
AssigneeBelluTech LLC
InventorsWeibin Zhu, Navid Yazdi
Life of this patent
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AssigneeBelluTech LLC
InventorsWeibin Zhu, Navid Yazdi
Estimating the term…
Sensors, systems, and methods for monitoring environmental conditions, such as physical, electromagnetic, thermal, and/or chemical parameters within an environment, over extended periods of time with the use of one or more electromechanical sensing devices and electronic circuitry for processing an output of the sensing devices. The sensing devices each include a cantilevered structure and at least one contact configured for contact-mode operation with the cantilevered structure in response to the cantilevered structure deflecting toward or away from the contact when exposed to the parameter of interest. The cantilevered structure has at least first and second beams of dissimilar materials, at least one of which has at least one property that changes as a result of exposure to the parameter.
An electromechanical sensing device comprising a cantilevered structure and at least one contact configured for contact-mode operation with the cantilevered structure, the cantilevered structure being responsive to a parameter within an environment and to deflect toward or away from the contact thereof in response to the parameter in the environment, the cantilevered structure comprising an anchor, first and second beams suspended from the anchor at first ends of the first and second beams, and a connector that interconnects distal ends of the first and second beams, the first and second beams containing dissimilar first and second materials, respectively, the first and second beams being side-by-side, spaced apart so as to define a gap therebetween along the lengths of the first and second beams, and lying in a plane that contains the cantilevered structure, the first material having at least one property that changes due to exposure to the parameter and a change in the property causes the cantilevered structure to deflect in a direction lying in the plane of the first and second beams as a result of the dissimilarity of the first and second materials, the cantilevered structure being configured to cause the connector to contact and close the contact or break contact and open the contact at a predetermined level of the parameter or from cumulative exposure to the parameter over time;
A sensor comprising:
Dependencies are inferred from the claim text.