Seam inspection apparatus
AssigneeFanuc Corporation
InventorKenji Takahashi
Life of this patent
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Abstract
A seam inspection apparatus can automatically determine the quality of an image of a seam of a sewn product. The seam inspection apparatus includes an image data acquisition unit that acquires image data of a seam of a sewn product, a feature extraction unit that extracts a feature quantity of the seam from the image data of the seam of the sewn product acquired by the image data acquisition unit, and a quality determination unit that performs quality determination of the seam based on the feature quantity of the seam.
Claims15
A seam inspection apparatus for determining quality of a seam of a sewn product, the apparatus comprising:
- an imaging device configured to acquire image data of the seam of the sewn product;
- and
- a processor configured to
- extract a feature quantity from a partial image which is a part of an entire image in the image data acquired by said imaging device, the entire image including a series of seams, and the partial image including a number of seams less than all of the seams in the entire image of the series of seams, and
- perform quality determination of the seam based on the feature quantity of the seam.
A seam inspection apparatus that determines quality of a seam of a sewn product, the apparatus comprising:
- an image data acquisition unit that acquires image data of the seam of the sewn product;
- a feature extraction unit that extracts a feature quantity of the seam from the image data of the seam of the sewn product acquired by the image data acquisition unit;
- and
- a quality determination unit that performs quality determination of the seam based on the feature quantity of the seam, wherein
- the quality determination unit is configured as a machine learning device in which supervised learning is performed by using a feature quantity of the seam of the sewn products and a quality result that is determined in advance for the sewn product as teacher data.
A seam inspection apparatus for determining quality of a seam of a sewn product, the apparatus comprising:
- an imaging device configured to acquire image data of the seam of the sewn product;
- and
- a processor configured to
- extract a feature quantity of the seam from the image data of the seam of the sewn product acquired by said imaging device, and
- perform quality determination of the seam based on the feature quantity of the seam, wherein
- the processor is configured to perform the quality determination on the basis of a result of a machine learning in which supervised learning is performed by using a feature quantity of the seam of the sewn products and a quality result that is determined in advance for the sewn product as teacher data.
Dependencies are inferred from the claim text.