Charged particle beam device
AssigneeHitachi High-Tech Corporation
InventorsRyo Kadoi, Wen Li, Naoya Ishigaki
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AssigneeHitachi High-Tech Corporation
InventorsRyo Kadoi, Wen Li, Naoya Ishigaki
Estimating the term…
The present invention prevents breakage of a chip by using a simple configuration even when an extraction-electrode power source cannot apply voltage to an extraction electrode due to a malfunction, etc. This charged particle beam device is provided with: a charged particle source; an extraction electrode that extracts charged particles from the charged particle source; an extraction-electrode power source that applies voltage to the extraction electrode; an accelerating electrode for accelerating the charged particles; an accelerating power source that applies voltage to the accelerating electrode; and a diode and a resistor which are connected in series between a middle stage of the accelerating power source and the output side of the extraction-electrode power source.
A charged particle beam device comprising:
A charged particle beam device comprising:
A charged particle beam device comprising:
A charged particle beam device comprising:
Dependencies are inferred from the claim text.