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US 10,969,505 B2Granted
Charged particle detector
AssigneeThe University of York
InventorsDavid Jenkins, Thomas Krauss, Christian Schuster
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Abstract
A charged particle detector is provided. The charged particle detector includes a flexible semiconductor wafer, the semiconductor wafer being doped to form a p-n junction, and an amplifier coupled to the semiconductor wafer and configured to amplify a current or voltage across the p-n junction.
Claims13
A charged particle detector comprising:
- a flexible semiconductor wafer, the semiconductor wafer being doped to form a p-n junction;
- an amplifier coupled to the semiconductor wafer and configured to amplify a current or voltage across the p-n junction;
- a layer of aluminium on each surface of the flexible semiconductor wafer, each layer of aluminium being of a thickness sufficient to exclude optical photons, and which is transparent to alpha particles;
- wherein the amplifier is coupled to the semiconductor wafer via the aluminium layers.
1 more element
Dependencies are inferred from the claim text.