System and method for x-ray fluorescence with filtering
AssigneeSigray, Inc.
InventorsWenbing Yun, Janos Kirz, Benjamin Donald Stripe, Sylvia Jia Yun Lewis
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AssigneeSigray, Inc.
InventorsWenbing Yun, Janos Kirz, Benjamin Donald Stripe, Sylvia Jia Yun Lewis
Estimating the term…
An x-ray optical filter includes at least one x-ray optical mirror configured to receive a plurality of x-rays having a first x-ray spectrum with a first intensity as a function of energy in a predetermined solid angle range and to separate at least some of the received x-rays by multilayer reflection or total external reflection into reflected x-rays and non-reflected x-rays and to form an x-ray beam including at least some of the reflected x-rays and/or at least some of the non-reflected x-rays. The x-ray beam has a second x-ray spectrum with a second intensity as a function of energy in the solid angle range, the second intensity greater than or equal to 50% of the first intensity across a first continuous energy range at least 3 keV wide, the second intensity less than or equal to 10% of the first intensity across a second continuous energy range at least 100 eV wide.
An x-ray optical filter comprising at least one x-ray optical mirror, the at least one x-ray optical mirror configured to receive a plurality of x-rays having a first x-ray spectrum with a first intensity as a function of energy in a predetermined solid angle range and to separate at least some of the received x-rays by multilayer reflection or total external reflection into reflected x-rays and non-reflected x-rays and to form an x-ray beam comprising at least some of the reflected x-rays and/or at least some of the non-reflected x-rays, the x-ray beam having a second x-ray spectrum with a second intensity as a function of energy in the solid angle range, the second intensity greater than or equal to 50% of the first intensity across a first continuous energy range at least 3 keV wide, the second intensity less than or equal to 10% of the first intensity across a second continuous energy range at least 100 eV wide.
A method of performing x-ray fluorescence analysis, the method comprising:
An x-ray system comprising:
An x-ray system comprising:
Dependencies are inferred from the claim text.