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US 10,955,437 B2Granted
Frequency modulation detection for photo induced force microscopy
AssigneeMolecular Vista, Inc.
InventorThomas R. Albrecht
Life of this patent
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Abstract
An atomic force microscope and method for detecting photo-induced force using the atomic force microscope utilizes light from a photonic source at a tip-sample interface that results in photo-induced force gradient, which is detected by measuring a resonant frequency of a vibrational mode of a cantilever of the atomic force microscope.
Claims18
An atomic force microscope comprising:
- a cantilever with a probe tip;
- a photonic source to irradiate a tip-sample interface that results in photo-induced force gradient;
- a deflection detector to sense vibration of the cantilever;
- and
- a signal processing circuitry to measure a resonant frequency of a vibrational mode of the cantilever using the sensed vibration of the cantilever to detect the photo-induced force gradient.
2 more elements
A method for detecting photo-induced force using an atomic force microscope comprising:
- irradiating a tip-sample interface with light from a photonic source that results in photo-induced force gradient;
- sensing vibrations of a cantilever of the atomic force microscope;
- and
- measuring a resonant frequency of a vibrational mode of the cantilever using the sensed vibration of the cantilever to detect the photo-induced force gradient.
1 more element
Dependencies are inferred from the claim text.