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US 10,950,692 B2Granted
Methods of forming air gaps between source/drain contacts and the resulting devices
AssigneeGlobalFoundries U.S. Inc.
InventorsRuilong Xie, Vimal Kamineni, Shesh Mani Pandey, Hui Zang
Life of this patent
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Abstract
One device disclosed herein includes, among other things, first and second active regions, a first source/drain contact positioned above the first active region, a second source/drain contact positioned above the second active region, and a dielectric material disposed between the first and second source/drain contacts, wherein the dielectric material defines an air gap cavity positioned between the first and second source/drain contacts.
Claims19
A device, comprising:
- first and second active regions;
- a first source/drain contact positioned above the first active region;
- a second source/drain contact positioned above the second active region, wherein the first source/drain contact is axially aligned with the second source/drain contact in a gate width direction of the device parallel to axial lengths of the first source/drain contact and the second source/drain contact, and a tip-to-toe region is defined between a first end of the first source/drain contact and second end of the second source/drain contact, wherein the first source/drain contact and the second source/drain contact each has a width less than the axial length, wherein the axial lengths and the widths are taken in a horizontal cross section;
- and
- a dielectric material disposed between the first and second source/drain contacts, wherein the dielectric material defines an air gap cavity positioned between the first and second source/drain contacts in the tip-to-toe region.
2 more elements
A device, comprising:
- first and second active regions;
- first and second gate structures formed above the first and second active regions;
- a first source/drain contact positioned above the first active region between the first and second gate structures;
- a second source/drain contact positioned above the second active region between the first and second gate structures, wherein the first source/drain contact is axially aligned with the second source/drain contact in a gate width direction of the device parallel to axial lengths of the first source/drain contact and the second source/drain contact, and a tip-to-toe region is defined between a first end of the first source/drain contact and second end of the second source/drain contact, wherein the first source/drain contact and the second source/drain contact each has a width less than the axial length, wherein the axial lengths and the widths are taken in a horizontal cross section;
- and
- a dielectric material disposed between the first and second source/drain contacts, wherein the dielectric material defines an air gap cavity positioned between the first and second source/drain contacts in the tip-to-toe region and extends from the first gate structure to the second gate structure in the tip-to-tip region.
3 more elements
A method, comprising:
- forming first and second active regions in a semiconductor substrate;
- forming a first source/drain contact positioned above the first active region;
- forming a second source/drain contact positioned above the second active region, wherein the first source/drain contact is axially aligned with the second source/drain contact in a gate width direction of the device parallel to axial lengths of the first source/drain contact and the second source/drain contact, and a tip-to-toe region is defined between a first end of the first source/drain contact and second end of the second source/drain contact, wherein the first source/drain contact and the second source/drain contact each has a width less than the axial length, wherein the axial lengths and the widths are taken in a horizontal cross section;
- and
- forming a dielectric material between the first and second source/drain contacts, wherein the dielectric material defines an air gap cavity positioned between the first and second source/drain contacts in the tip-to-toe region.
2 more elements
Dependencies are inferred from the claim text.