Semiconductor packages with electromagnetic interference shielding layer and methods of forming the same
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsChen-Hua Yu, Kuo-Chung Yee, Chun-Hui Yu
Life of this patent
Estimating the term…
Abstract
Semiconductor packages and methods of forming the same are provided. a semiconductor package includes a sub-package, a second die and a second molding layer. The sub-package includes a first die, a first molding layer aside the first die and a first redistribution layer structure disposed over the first die and the first molding layer and electrically connected to the first die. The second die is disposed over the sub-package, wherein the first die and the second die are disposed on opposite surfaces of the first redistribution layer structure. The second molding layer encapsulates the sub-package and the second die.
Claims20
A semiconductor package, comprising:
- a sub-package, comprising a first die, a first molding layer aside the first die and a first redistribution layer structure disposed over the first die and the first molding layer and electrically connected to the first die;
- a second die disposed aside the sub-package;
- a first electromagnetic interference shielding layer, wherein the first electromagnetic interference shielding layer is continuous on and in physical and direct contact with all sides of the second die;
- a second molding layer, encapsulating the sub-package and the second die;
- a second electromagnetic interference shielding layer covering the sub-package and the second molding layer;
- and
- a first adhesive layer between the second die and the second electromagnetic interference shielding layer, wherein a first portion of the first electromagnetic interference shielding layer on a top surface of the second die is in physical and direct contact with the first adhesive layer, and a second portion of the first electromagnetic interference shielding layer on the top surface of the second die is in physical and direct contact with the second electromagnetic interference shielding layer.
A semiconductor package, comprising:
- a sub-package, comprising a first die, a first molding layer aside the first die and a first redistribution layer structure disposed over the first die and the first molding layer and electrically connected to the first die;
- a second die, disposed aside the sub-package and comprising a first electromagnetic interference shielding layer covering thereover;
- a second molding layer, encapsulating the sub-package and the second die;
- a second electromagnetic interference shielding layer covering the sub-package and the second molding layer;
- and
- a first adhesive layer, wherein a surface of the sub-package, a surface of the second molding layer and a surface of the first electromagnetic interference shielding layer on a top surface of the second die are substantially coplanar with each other and are in physical and direct contact with the first adhesive layer, wherein a first portion of the first electromagnetic interference shielding layer on the top surface of the second die is in physical and direct contact with the first adhesive layer, and a second portion of the first electromagnetic interference shielding layer on the top surface of the second die is in physical and direct contact with the second electromagnetic interference shielding layer.
A method of forming a semiconductor package, comprising:
- providing a sub-package onto a carrier through a first adhesive layer, wherein the sub-package comprises a first die, a first molding layer aside the first die and a first redistribution layer structure disposed over the first die and the first molding layer and electrically connected to the first die;
- forming a second die aside the sub-package on the first adhesive layer;
- forming a first electromagnetic interference shielding layer, wherein the first electromagnetic interference shielding layer is continuous on and in physical and direct contact with all sides of the second die;
- forming a second molding layer to encapsulate the sub-package and the second die;
- and
- forming a second electromagnetic interference shielding layer covering the sub-package and the second molding layer, wherein the first adhesive layer is disposed between the second die and the second electromagnetic interference shielding layer, a first portion of the first electromagnetic interference shielding layer on a top surface of the second die is in physical and direct contact with the first adhesive layer, and a second portion of the first electromagnetic interference shielding layer on the top surface of the second die is in physical and direct contact with the second electromagnetic interference shielding layer.
Dependencies are inferred from the claim text.