Enhancing integrated circuit density with active atomic reservoir
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsTa-Pen Guo, Ming-Hsien Lin
Life of this patent
Estimating the term…
Abstract
Methods are disclosed herein for fabricating integrated circuit interconnects that can improve electromigration. An exemplary method includes forming a first metal layer of an integrated circuit and forming a second metal layer of the integrated circuit. The first metal layer includes a first conductor electrically coupled to a second conductor, and the second metal layer includes a third conductor electrically coupled to the first conductor. The first conductor, the second conductor, and the third conductor are configured, such that electrons flow from the second conductor to an area of the first conductor where electrons flow from the third conductor to the first conductor.
Claims20
A method comprising:
- forming a first power rail configured for biasing to a first voltage, wherein the first power rail includes a first portion oriented along a first direction and a second portion oriented along a second direction that is substantially perpendicular to the first direction, wherein the second portion is physically connected to the first portion;
- forming a second power rail configured for biasing to a second voltage, wherein the second power rail is oriented along the second direction, wherein a width of the second portion of the first power rail is different than a width of the second power rail;
- and
- forming a first via that connects the first portion of the first power rail to the second power rail and a second via that connects the second portion of the first power rail to the second power rail.
A method comprising:
- forming a first power rail, a second power rail, a first conductor, and a second conductor in a first metal layer of an interconnect structure, wherein the first power rail and the second power rail extend lengthwise along a first direction, the first conductor and the second conductor extend lengthwise along a second direction that is different than the first direction, and the first conductor and the second conductor are connected to the first power rail;
- forming a third power rail and a fourth power rail in a second metal layer of the interconnect structure, wherein the third power rail and the fourth power rail are oriented lengthwise along the second direction;
- and
- forming a first via, a second via, a third via, and a fourth via, wherein the first via connects the first power rail to the third power rail, the second via connects the first power rail to the fourth power rail, the third via connects the first conductor to the third power rail, and the fourth via connects the second conductor to the fourth power rail.
A method comprising:
- forming a first dielectric layer over a substrate;
- performing a first lithography process to define a first trench and a second trench in the first dielectric layer, wherein the first trench extends lengthwise along a first direction, the second trench extends lengthwise along a second direction that is different than the first direction, and the second trench is connected to the first trench;
- filling the first trench and the second trench with a first metal material to form a first power rail having a first portion that extends lengthwise along the first direction and a second portion that extends lengthwise along the second direction, wherein the second portion is connected to the first portion;
- forming a second dielectric layer over the first dielectric layer;
- performing a second lithography process to define a third trench in the second dielectric layer, wherein the third trench is disposed directly over the second portion of the first power rail and extends lengthwise along the second direction, and further wherein the third trench has a first lower portion that exposes the first portion of the first power rail, a second lower portion that exposes the second portion of the first power rail, and an upper portion that spans the first lower portion and the second lower portion;
- and
- filling the third trench with a second metal material to form a first via in the first lower portion of the third trench, a second via in the second lower portion of the third trench, and a second power rail in the upper portion of the third trench, wherein the first via connects the first portion of the first power rail to the second power rail and the second via connects the second portion of the first power rail to the second power rail.
Dependencies are inferred from the claim text.