Application method of demura data having uniform format
AssigneeTcl China Star Optoelectronics Technology Co., Ltd.
InventorsGuanxian He, Keyuan Liu
Life of this patent
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AssigneeTcl China Star Optoelectronics Technology Co., Ltd.
InventorsGuanxian He, Keyuan Liu
Estimating the term…
An application method of demura data having a uniform format includes: in step S12, it is determined whether demura data having a first format is stored in a first memory; if yes, step S13 is performed; if no, step S16 is performed; in step S13, it is checked whether the demura data having the first format is consistent with demura data having a second format and stored in a second memory; if yes, step S14 is performed; if no, step S16 is performed; in step S14, the demura data having the first format in the first memory is read; in step S15, a demura data compensation is activated; and in step S16, demura data having the first format is generated, according to the demura data having the second format and stored in the second memory, and stored; step S15 is performed.
An application method of demura data having a uniform format, comprising:
Dependencies are inferred from the claim text.