Model order reduction in transistor level timing
AssigneeInternational Business Machines Corporation
InventorsRobert J. Allen, Yanai Danan, Vasant Rao, Jeffrey P. Soreff, Xin Zhao
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AssigneeInternational Business Machines Corporation
InventorsRobert J. Allen, Yanai Danan, Vasant Rao, Jeffrey P. Soreff, Xin Zhao
Estimating the term…
A method of performing transistor simulation with improved sensitivity to parasitic by model order reduction in transistor-level timing is disclosed. The method includes reducing a number of derivative calculations during transistor simulation by representing parasitics as a reduced-order model, wherein the reducing includes: compressing the parasitics to a reduced-order model; simulating with load which is replaced with the reduced-order model; differentiating results of the simulation with respect to reduced-order model parameters; differentiating parameters of the reduced-order model with respect to parasitic values; differentiating the parasitic values with respect to statistical parameters; and computing the differential results of the simulation with respect to the statistical parameters via chain ruling.
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