Techniques using nonvolatile memory and volatile memory
AssigneeMicron Technology, Inc.
InventorsSujeet V. Ayyapureddi, Andrew F. Laforge
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AssigneeMicron Technology, Inc.
InventorsSujeet V. Ayyapureddi, Andrew F. Laforge
Estimating the term…
Devices and methods for using nonvolatile memory and volatile memory are described. As volatile memory cells may not retain information absent power, nonvolatile memory cells (e.g., antifuses, phase-change memory cells, ferroelectric memory cells) may store various information related to operating conditions of the volatile memory cells. For example, an operating condition (e.g., voltage, temperature, a timing parameter for command, or refresh rate) of volatile memory cells may exceed an operating limit causing the volatile memory cells to fail. An indication of the operating condition of the volatile memory cells may be stored in nonvolatile memory cells to be retrieved later. The indication stored in the nonvolatile memory cells may facilitate analytical processes to identify root-causes that may have caused the volatile memory cells to fail. Nonvolatile memory cells may be configured to indicate whether such an operating condition exists and provide specific information about the operating condition.
A method, comprising:
A method, comprising:
A memory device, comprising:
Dependencies are inferred from the claim text.