Single-layer sensor array scan
AssigneeSynaptics Incorporated
InventorTetsuo Tanemura
Life of this patent
Estimating the term…
Abstract
A method of performing a scan of a sensor array is disclosed, as well as an associated processing system and input device. The sensor array comprises a plurality of sensor electrodes in a single layer. A plurality of routing traces is arranged in the single layer. The method comprises, for each sensor electrode of the plurality of sensor electrodes, acquiring, during a first period, an absolute capacitive measurement for the sensor electrode. The method further comprises, for each bordering sensor electrode of one or more bordering sensor electrodes of the plurality of sensor electrodes, acquiring, during a second period, a transcapacitive measurement between the sensor electrode and the bordering sensor electrode.
Claims28
An input device comprising:
- a sensor array comprising a plurality of sensor electrodes of a same type in a single-layer arrangement, wherein each sensor electrode of the plurality of sensor electrodes is bordered by a respective one or more other sensor electrodes of the plurality of sensor electrodes;
- and
- a processing system coupled with the plurality of sensor electrodes, the processing system configured to:
- during a first period of a single scan of the sensor array:
- drive each sensor electrode of the plurality of sensor electrodes with a modulated signal;
- and
- acquire a respective absolute capacitive measurement for each sensor electrode of the plurality of sensor electrodes;
- and
- during a second period of the single scan:
- drive, according to a predefined sequence, different groups of sensor electrodes selected from the plurality of sensor electrodes;
- acquire a plurality of transcapacitive measurements responsive to driving the different groups;
- and
- determine, using the plurality of transcapacitive measurements, a respective transcapacitive measurement between each sensor electrode of the plurality of sensor electrodes and each of the one or more other sensor electrodes bordering the respective sensor electrode.
A processing system comprising:
- sensing circuitry configured to:
- couple with a sensor array via a plurality of routing traces, wherein the sensor array comprises a plurality of sensor electrodes of a same type in a single-layer arrangement, wherein each sensor electrode of the plurality of sensor electrodes is bordered by a respective one or more other sensor electrodes of the plurality of sensor electrodes;
- and
- perform a single scan of the sensor array, wherein performing the single scan of the sensor array comprises:
- during a first period:
- drive each sensor electrode of the plurality of sensor electrodes with a modulated signal;
- and
- acquire a respective absolute capacitive measurement for each sensor electrode of the plurality of sensor electrodes;
- and
- during a second period:
- drive, according to a predefined sequence, different groups of sensor electrodes selected from the plurality of sensor electrodes;
- acquire a plurality of transcapacitive measurements responsive to driving the different groups;
- and
- determine, using the plurality of transcapacitive measurements, a respective transcapacitive measurement between each sensor electrode of the plurality of sensor electrodes and each of the one or more other sensor electrodes bordering the respective sensor electrode.
A method of performing a single scan of a sensor array of an input device, the sensor array comprising a plurality of sensor electrodes of a same type in a single-layer arrangement, wherein each sensor electrode of the plurality of sensor electrodes is bordered by a respective one or more other sensor electrodes of the plurality of sensor electrodes, the input device further comprising a plurality of routing traces arranged in a same layer as the plurality of sensor electrodes, the method comprising:
- during a first period of the single scan:
- driving each sensor electrode of the plurality of sensor electrodes with a modulated signal;
- and
- acquiring a respective absolute capacitive measurement for each sensor electrode of the plurality of sensor electrodes;
- and
- during a second period of the single scan:
- driving, according to a predefined sequence, different groups of sensor electrodes selected from the plurality of sensor electrodes;
- acquiring a plurality of transcapacitive measurements responsive to driving the different groups;
- and
- determining, using the plurality of transcapacitive measurements, a respective transcapacitive measurement between each sensor electrode of the plurality of sensor electrodes and each of the one or more other sensor electrodes bordering the respective sensor electrode.
Dependencies are inferred from the claim text.