Test apparatus for testing electronic device

A test apparatus for testing electronic device, comprising:

• a lower base comprising a chip socket for receiving a plurality of probes, and a test socket plate having a first guiding device;
• each of the probes has a spring force stored therein;
• an upper base having a second guiding device coupled to the first guiding device of the lower base;
• and
• a pressing force generating module disposed between the upper and lower bases;
• wherein an electronic device to be tested is placed in the chip socket, and the upper base in a first position is slidably moved to a second position with respect to the lower base by cooperative actions between the first and second guiding devices, wherein, an area of the upper base in the second position is substantially non-overlapped with a corresponding area of the upper base in the first position, when viewed from a direction orthogonal to the slidably moved direction, the second position is a position where the pressing force generating module is in alignment with the electronic device for applying a pressing force on the electronic device, and the pressing force being greater than the sum of the spring forces generated by the plurality of probes.