Test device and method

A test method, applied in a test device, comprising:

• when a first connection interface of a test device is coupled to a device under test (DUT), sending a first instruction to the DUT through the first connection interface to obtain power information from the DUT;
• storing the power information in a storage device of the test device, wherein the storage device is externally connected to a processor of the test device;
• when an external controlling system sends a serial instruction to request the power information of the DUT, sending the power information to the external controlling system through a second connection interface of the test device;
• and
• receiving a test instruction from the external controlling system through the second connection interface to test the DUT,
• wherein the test method further comprising:
• converting, by a first controller of the test device, a first communication format which is applicable to the first connection interface to a second communication format which is applicable to the processor;
• and
• converting, by the processor of the test device, the second communication format which is applicable to the processor to a third communication format which is applicable to the second connection interface.